Assignee
LEDERMAN DAVID
US·1 granted patent·1 pending application·32 citations·filing 2007–2011
Top patents by PatentIndex Score
2 records- 0189US8513603B1In-situ determination of thin film and multilayer structure and chemical composition using x-ray fluorescence induced by grazing incidence electron beams during thin film growthLEDERMAN DAVID·Filed 2011·Granted Aug 20, 2013·32 cites·16 claims
- 0244US2008160638A1Functionalized Microcantilever Sensor and Associated Method For Detection of Targeted AnalytesLEDERMAN DAVID·Filed 2007·Application pending·0 cites
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