Assignee

LACROIX YVES

JP·1 granted patent·0 citations·filing 2011–2011

Technology mixC23C1 C30B1 G01K1 H01L1 H10P1

Top patents by PatentIndex Score

1 record

0132US9823132B2Method and apparatus for measuring temperature of semiconductor layerLACROIX YVES·Filed 2011·Granted Nov 21, 2017·0 cites·10 claims

Join the waitlist — get patent alerts

Get an alert when LACROIX YVES files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →