Assignee
KURIHARA MASAKI
JP·4 granted patents·2 pending applications·18 citations·filing 2005–2012
Top patents by PatentIndex Score
6 records- 0187US8581976B2Method and apparatus for reviewing defects of semiconductor deviceKURIHARA MASAKI·Filed 2011·Granted Nov 12, 2013·7 cites·3 claims
- 0282US8786739B2Photoelectric conversion device and imaging systemKURIHARA MASAKI·Filed 2009·Granted Jul 22, 2014·7 cites·14 claims
- 0370US8995773B2Image measurement apparatus and method of measuring works using edge detection toolsKURIHARA MASAKI·Filed 2012·Granted Mar 31, 2015·3 cites·11 claims
- 0459US9140541B2Image measuring apparatus and image measuring methodKURIHARA MASAKI·Filed 2011·Granted Sep 22, 2015·1 cites·12 claims
- 0553US2012043634A1Method of manufacturing microlens array, method of manufacturing solid-state image sensor, and solid-state image sensorKURIHARA MASAKI·Filed 2011·Application pending·0 cites
- 0639US2006078188A1Method and its apparatus for classifying defectsKURIHARA MASAKI·Filed 2005·Application pending·0 cites
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