Assignee
KURIBAYASHI HIDETO
JP·6 granted patents·4 citations·filing 2007–2007
Top patents by PatentIndex Score
6 records- 0183US8404822B2Probe, probe set, probe-immobilized carrier, and genetic testing methodKURIBAYASHI HIDETO·Filed 2007·Granted Mar 26, 2013·3 cites·7 claims
- 0262US8187816B2Probe set, probe-immoblized carrier, and genetic testing method for detecting Anaerococcus prevotiiKURIBAYASHI HIDETO·Filed 2007·Granted May 29, 2012·0 cites·13 claims
- 0362US8129109B2Probe, probe set, probe-immobilized carrier, and genetic testing methodKURIBAYASHI HIDETO·Filed 2007·Granted Mar 6, 2012·0 cites·13 claims
- 0456US8207319B2Probe, probe set, probe-immobilized carrier, and genetic testing methodKURIBAYASHI HIDETO·Filed 2007·Granted Jun 26, 2012·0 cites·13 claims
- 0556US8158350B2Probe, probe set, probe-immobilized carrier, and genetic testing methodKURIBAYASHI HIDETO·Filed 2007·Granted Apr 17, 2012·1 cites·11 claims
- 0647US8148073B2Probe, probe set, probe-immobilized carrier, and genetic testing methodKURIBAYASHI HIDETO·Filed 2007·Granted Apr 3, 2012·0 cites·11 claims
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