Assignee
KATO SEIMA
JP·5 granted patents·1 pending application·17 citations·filing 2005–2011
Top patents by PatentIndex Score
6 records- 0183US8525982B2Refractive index distribution measuring method and refractive index distribution measuring apparatusKATO SEIMA·Filed 2011·Granted Sep 3, 2013·6 cites·11 claims
- 0283US8508725B2Refractive index distribution measuring method and apparatus using position measurement and a reference objectKATO SEIMA·Filed 2010·Granted Aug 13, 2013·6 cites·8 claims
- 0367US8477297B2Refractive index distribution measuring method and apparatus, and method of producing optical element thereof, that use multiple transmission wavefronts of a test object immersed in at least one medium having a different refractive index from that of the test object and multiple reference transmission wavefronts of a reference object having known shape and refractive index distributionKATO SEIMA·Filed 2011·Granted Jul 2, 2013·1 cites·8 claims
- 0464US8786863B2Transmitted wavefront measuring method, refractive-index distribution measuring method, and transmitted wavefront measuring apparatus that calculate a frequency distribution and obtain a transmitted wavefront of the object based on a primary frequency spectrum in the frequency distributionKATO SEIMA·Filed 2010·Granted Jul 22, 2014·2 cites·5 claims
- 0555US8472013B2Refractive index distribution measurement method and apparatus that measure transmission wavefronts of a test object immersed in different media having refractive index lower than that of the test objectKATO SEIMA·Filed 2009·Granted Jun 25, 2013·2 cites·14 claims
- 0639US2006072091A1Exposure apparatusKATO SEIMA·Filed 2005·Application pending·0 cites
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