Assignee
JINDAL ANURAG
US·6 granted patents·1 pending application·27 citations·filing 2011–2014
Top patents by PatentIndex Score
7 records- 0189US9297855B1Integrated circuit with increased fault coverageJINDAL ANURAG·Filed 2014·Granted Mar 29, 2016·18 cites·19 claims
- 0281US9213063B2Reset generation circuit for scan mode exitJINDAL ANURAG·Filed 2014·Granted Dec 15, 2015·4 cites·13 claims
- 0375US8872252B2Multi-tiered semiconductor apparatuses including residual silicide in semiconductor tierJINDAL ANURAG·Filed 2011·Granted Oct 28, 2014·3 cites·13 claims
- 0467US9599673B2Structural testing of integrated circuitsJINDAL ANURAG·Filed 2014·Granted Mar 21, 2017·2 cites·8 claims
- 0543US9330975B2Integrated circuit substrates comprising through-substrate vias and methods of forming through-substrate viasJINDAL ANURAG·Filed 2012·Granted May 3, 2016·0 cites·17 claims
- 0643US9201116B1Method of generating test patterns for detecting small delay defectsJINDAL ANURAG·Filed 2014·Granted Dec 1, 2015·0 cites·13 claims
- 0739US2012314171A1Display devices having electrolessly plated conductors and methodsJINDAL ANURAG·Filed 2011·Application pending·0 cites
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