Assignee
IONICS MASS SPECTROMETRY GROUP
CA·10 granted patents·1 pending application·138 citations·filing 2004–2013
Top patents by PatentIndex Score
11 records- 0196US7405398B2Mass spectrometer interfaceIONICS MASS SPECTROMETRY GROUP·Filed 2006·Granted Jul 29, 2008·23 cites·21 claims
- 0294US7868289B2Mass spectrometer ion guide providing axial field, and methodIONICS MASS SPECTROMETRY GROUP·Filed 2007·Granted Jan 11, 2011·23 cites·25 claims
- 0394US7569811B2Concentrating mass spectrometer ion guide, spectrometer and methodIONICS MASS SPECTROMETRY GROUP·Filed 2006·Granted Aug 4, 2009·22 cites·58 claims
- 0494US7091477B2Mass spectrometer interfaceIONICS MASS SPECTROMETRY GROUP·Filed 2004·Granted Aug 15, 2006·41 cites·38 claims
- 0592US7728292B2Method and apparatus for detecting positively charged and negatively charged ionized particlesIONICS MASS SPECTROMETRY GROUP·Filed 2006·Granted Jun 1, 2010·14 cites·31 claims
- 0688US7687771B2High sensitivity mass spectrometer interface for multiple ion sourcesIONICS MASS SPECTROMETRY GROUP·Filed 2007·Granted Mar 30, 2010·10 cites·37 claims
- 0776US8008619B2High sensitivity mass spectrometer interface for multiple ion sourcesIONICS MASS SPECTROMETRY GROUP·Filed 2010·Granted Aug 30, 2011·3 cites·14 claims
- 0867US7659505B2Ion source vessel and methodsIONICS MASS SPECTROMETRY GROUP·Filed 2008·Granted Feb 9, 2010·1 cites·46 claims
- 0964US8044348B2Ion source vessel and methodsIONICS MASS SPECTROMETRY GROUP·Filed 2009·Granted Oct 25, 2011·1 cites·15 claims
- 1056US8946622B2Mass spectrometer interfaceIONICS MASS SPECTROMETRY GROUP·Filed 2013·Granted Feb 3, 2015·0 cites·20 claims
- 1149US2010252729A1Method and apparatus for detecting positively charged and negatively charged ionized particlesIONICS MASS SPECTROMETRY GROUP·Filed 2010·Application pending·0 cites
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