Assignee
ION-TOF TECH GMBH
DE·1 granted patent·1 pending application·1 citations·filing 2016–2017
Top patents by PatentIndex Score
2 records- 0156US10215719B2Secondary ion mass spectroscopic method, mass spectrometer and uses thereofION TOF TECH GMBH·Filed 2017·Granted Feb 26, 2019·1 cites·18 claims
- 0244US2016254134A1Mass spectrometer and liquid-metal ion source for a mass spectrometer of this typeION-TOF TECH GMBH·Filed 2016·Application pending·0 cites
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