Assignee
IMAI SHINJIRO
JP·1 granted patent·2 pending applications·6 citations·filing 2007–2012
Top patents by PatentIndex Score
3 records- 0181US8173400B2Method of detecting or quantitating endogenous wheat DNA and method of determining contamination rate of genetically modified wheat in test sampleIMAI SHINJIRO·Filed 2007·Granted May 8, 2012·6 cites·10 claims
- 0254US2012208992A1Method of detecting or quantitating endogenous wheat dna and method of determining contamination rate of genetically modified wheat in test sampleIMAI SHINJIRO·Filed 2012·Application pending·0 cites
- 0349US2012214161A1Method of detecting or quantitating endogenous wheat dna and method of determining contamination rate of genetically modified wheat in test sampleIMAI SHINJIRO·Filed 2012·Application pending·0 cites
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