Assignee
HITACHI ELECTR ENG
JP·78 granted patents·1 pending application·2,106 citations·filing 1977–2003
Top patents by PatentIndex Score
79 records- 0192US5903342AInspection method and device of wafer surfaceHITACHI ELECTR ENG·Filed 1996·Granted May 11, 1999·218 cites·16 claims
- 0291US6515470B2Method and apparatus for testing IC deviceHITACHI ELECTR ENG·Filed 2001·Granted Feb 4, 2003·87 cites·5 claims
- 0391US6275023B1Semiconductor device tester and method for testing semiconductor deviceHITACHI ELECTR ENG·Filed 2000·Granted Aug 14, 2001·74 cites·16 claims
- 0490US6617603B2Surface defect testerHITACHI ELECTR ENG·Filed 2002·Granted Sep 9, 2003·43 cites·15 claims
- 0590US6509966B2Optical system for detecting surface defect and surface defect tester using the sameHITACHI ELECTR ENG·Filed 2001·Granted Jan 21, 2003·45 cites·12 claims
- 0689US4173073ATrack displacement detecting and measuring systemHITACHI ELECTR ENG·Filed 1977·Granted Nov 6, 1979·56 cites·5 claims
- 0788US6631726B1Apparatus and method for processing a substrateHITACHI ELECTR ENG·Filed 2000·Granted Oct 14, 2003·44 cites·27 claims
- 0888US6366982B1Raid library apparatus for transportable media and method of controlling the library apparatusHITACHI ELECTR ENG·Filed 1999·Granted Apr 2, 2002·55 cites·9 claims
- 0987US5694214ASurface inspection method and apparatusHITACHI ELECTR ENG·Filed 1996·Granted Dec 2, 1997·86 cites·9 claims
- 1085US5245403AApparatus for detecting extraneous substances on a glass plateHITACHI ELECTR ENG·Filed 1991·Granted Sep 14, 1993·71 cites·12 claims
- 1184US5092011ADisk washing apparatusHITACHI ELECTR ENG·Filed 1991·Granted Mar 3, 1992·41 cites·11 claims
- 1283US6815198B2Apparatus for automated preparation of DNA samples and reactor for preparing DNA samplesHITACHI ELECTR ENG·Filed 2001·Granted Nov 9, 2004·12 cites·31 claims
- 1382US5014143AData recording disk chuck mechanismHITACHI ELECTR ENG·Filed 1990·Granted May 7, 1991·45 cites·11 claims
- 1480US5998994AMR head offset correction method and magnetic disk certifierHITACHI ELECTR ENG·Filed 1998·Granted Dec 7, 1999·35 cites·13 claims
- 1580US5423111AMagnetic disk testerHITACHI ELECTR ENG·Filed 1993·Granted Jun 13, 1995·38 cites·8 claims
- 1679US6473258B1Magnetic disk read/write circuit having core coils of opposite phaseHITACHI ELECTR ENG·Filed 2000·Granted Oct 29, 2002·14 cites·11 claims
- 1779US6414510B1Testing apparatus and method of IC devicesHITACHI ELECTR ENG·Filed 2000·Granted Jul 2, 2002·27 cites·20 claims
- 1879US5822139AMethod of detecting thermal asperity error of MR head and magnetic disk certifier using the same methodHITACHI ELECTR ENG·Filed 1996·Granted Oct 13, 1998·48 cites·12 claims
- 1979US5644393AExtraneous substance inspection method and apparatusHITACHI ELECTR ENG·Filed 1996·Granted Jul 1, 1997·51 cites·10 claims
- 2078US6204681B1IC device contactorHITACHI ELECTR ENG·Filed 1999·Granted Mar 20, 2001·51 cites·6 claims
- 2177US7035039B2Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridgeHITACHI ELECTR ENG·Filed 2002·Granted Apr 25, 2006·12 cites·22 claims
- 2277US6418640B1Drying apparatus for a substrate and drying method thereofHITACHI ELECTR ENG·Filed 2000·Granted Jul 16, 2002·24 cites·9 claims
- 2374US6138257AIC testing apparatus and methodHITACHI ELECTR ENG·Filed 1998·Granted Oct 24, 2000·43 cites·8 claims
- 2474US5879576AMethod and apparatus for processing substratesHITACHI ELECTR ENG·Filed 1997·Granted Mar 9, 1999·50 cites·16 claims
- 2574US4126983ABinding tape dealing apparatus for paper bundle binding apparatusHITACHI ELECTR ENG·Filed 1977·Granted Nov 28, 1978·26 cites·5 claims
- 2674US4126982AApparatus for binding a stack of paper sheetsHITACHI ELECTR ENG·Filed 1977·Granted Nov 28, 1978·25 cites·5 claims
- 2772US6351228B1Digital calibration method and apparatus for A/D or D/A convertersHITACHI ELECTR ENG·Filed 2000·Granted Feb 26, 2002·29 cites·11 claims
- 2872US5851102ADevice and method for positioning a notched waferHITACHI ELECTR ENG·Filed 1997·Granted Dec 22, 1998·47 cites·6 claims
- 2971US6376231B1Sample loading sheetHITACHI ELECTR ENG·Filed 2000·Granted Apr 23, 2002·21 cites·7 claims
- 3071US5898491ASurface defect test method and surface defect testerHITACHI ELECTR ENG·Filed 1998·Granted Apr 27, 1999·41 cites·15 claims
- 3171US5880828ASurface defect inspection device and shading correction method thereforHITACHI ELECTR ENG·Filed 1997·Granted Mar 9, 1999·36 cites·10 claims
- 3270US6421932B2Method and apparatus for drying substrate platesHITACHI ELECTR ENG·Filed 2001·Granted Jul 23, 2002·12 cites·11 claims
- 3370US5818576AExtraneous substance inspection apparatus for patterned waferHITACHI ELECTR ENG·Filed 1996·Granted Oct 6, 1998·36 cites·9 claims
- 3469US6448799B1Timing adjustment method and apparatus for semiconductor IC testerHITACHI ELECTR ENG·Filed 2000·Granted Sep 10, 2002·26 cites·16 claims
- 3569US4117650ATape winding arrangement for paper bundle binding apparatusHITACHI ELECTR ENG·Filed 1977·Granted Oct 3, 1978·20 cites·4 claims
- 3669US4111116AApparatus for clamping and binding a stack of paperHITACHI ELECTR ENG·Filed 1977·Granted Sep 5, 1978·20 cites·5 claims
- 3768US6353473B1Wafer thickness measuring apparatus and detection method thereofHITACHI ELECTR ENG·Filed 2000·Granted Mar 5, 2002·17 cites·18 claims
- 3867US6790300B2Method and apparatus for bonding substrate plates together through gap-forming sealer materialHITACHI ELECTR ENG·Filed 2001·Granted Sep 14, 2004·9 cites·11 claims
- 3967US6661912B1Inspecting method and apparatus for repeated micro-miniature patternsHITACHI ELECTR ENG·Filed 1998·Granted Dec 9, 2003·29 cites·12 claims
- 4067US5552322ADNA base sequencerHITACHI ELECTR ENG·Filed 1994·Granted Sep 3, 1996·33 cites·5 claims
- 4165US6057926AMagnetic disk testing method and surface defect testing deviceHITACHI ELECTR ENG·Filed 1998·Granted May 2, 2000·29 cites·17 claims
- 4264US6348810B1Interface unit for a tester and method of connecting a tester with a semiconductor device to be testedHITACHI ELECTR ENG·Filed 1999·Granted Feb 19, 2002·30 cites·8 claims
- 4364US5885143ADisk texturing apparatusHITACHI ELECTR ENG·Filed 1997·Granted Mar 23, 1999·27 cites·5 claims
- 4463US6004487AMethod and apparatus for laser-texturing disk surfacesHITACHI ELECTR ENG·Filed 1998·Granted Dec 21, 1999·24 cites·15 claims
- 4563US5488857AProtrusion sensor for sensing protrusion on a discHITACHI ELECTR ENG·Filed 1994·Granted Feb 6, 1996·28 cites·11 claims
- 4662US6448800B1Load current output circuit for electronic device and IC tester using the same load current output circuitHITACHI ELECTR ENG·Filed 2000·Granted Sep 10, 2002·11 cites·13 claims
- 4762US5875027ASensitivity calibration disk for surface defect testerHITACHI ELECTR ENG·Filed 1998·Granted Feb 23, 1999·16 cites·12 claims
- 4857US6552535B2Defect detector circuit with a signal synthesizer and magnet disk certifier using the same defect detector circuitHITACHI ELECTR ENG·Filed 2001·Granted Apr 22, 2003·6 cites·12 claims
- 4954US5556529ADNA base sequencerHITACHI ELECTR ENG·Filed 1995·Granted Sep 17, 1996·24 cites·6 claims
- 5053US5675462ADisk used for calibrating floating height of protrusion detection head, method of calibrating floating height of protrusion detection head using the disk and glide tester using the methodHITACHI ELECTR ENG·Filed 1995·Granted Oct 7, 1997·14 cites·13 claims
Showing the top 50 of 79 patent records by PatentIndex Score.
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