Assignee
HESS CHRISTOPHER
US·2 granted patents·82 citations·filing 2004–2011
Top patents by PatentIndex Score
2 records- 0192US8178876B2Method and configuration for connecting test structures or line arrays for monitoring integrated circuit manufacturingHESS CHRISTOPHER·Filed 2004·Granted May 15, 2012·81 cites·42 claims
- 0260US8901951B1High density test structure array to support addressable high accuracy 4-terminal measurementsHESS CHRISTOPHER·Filed 2011·Granted Dec 2, 2014·1 cites·16 claims
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