Assignee
HAYASHI HIROYUKI
JP·6 granted patents·7 pending applications·10 citations·filing 2005–2013
Top patents by PatentIndex Score
13 records- 0183US8591712B2Gas sensor element and gas sensorHAYASHI HIROYUKI·Filed 2012·Granted Nov 26, 2013·5 cites·3 claims
- 0279US8748437B2Crystal of 2-(3,4 dichlorobenzyl)-5-methyl-4-oxo-3,4-dihydrothien[2,3-D]pyrimidine-6-carboxylic acidHAYASHI HIROYUKI·Filed 2011·Granted Jun 10, 2014·4 cites·12 claims
- 0368US8116180B2Optical disc recording device and recording method thereofHAYASHI HIROYUKI·Filed 2007·Granted Feb 14, 2012·1 cites·1 claims
- 0455US9148641B2Imaging apparatus for acquiring position information of imaging apparatus during imaging and program thereofHAYASHI HIROYUKI·Filed 2009·Granted Sep 29, 2015·0 cites·22 claims
- 0548US2010296166A1Process for producing transparent electroconductive memberHAYASHI HIROYUKI·Filed 2008·Application pending·0 cites
- 0647US8604432B2Defect inspection apparatus and defect inspection methodHAYASHI HIROYUKI·Filed 2012·Granted Dec 10, 2013·0 cites·19 claims
- 0747US2013296393A1Method for controlling clubrootHAYASHI HIROYUKI·Filed 2012·Application pending·0 cites
- 0846US2009148129A1Audio visual deviceHAYASHI HIROYUKI·Filed 2006·Application pending·0 cites
- 0945US9542131B2Image forming apparatus for retrieving print data using an address of the stored print dataHAYASHI HIROYUKI·Filed 2013·Granted Jan 10, 2017·0 cites·11 claims
- 1044US2009046160A1Camera shake correcting deviceHAYASHI HIROYUKI·Filed 2005·Application pending·0 cites
- 1143US2014061461A1Defect inspection apparatus, defect inspection method and non-transitory computer readable recording mediumHAYASHI HIROYUKI·Filed 2012·Application pending·0 cites
- 1238US2011293167A1Defect inspecting method, defect inspecting apparatus, and recording mediumHAYASHI HIROYUKI·Filed 2011·Application pending·0 cites
- 1337US2015128740A1Scissors Gear DeviceHAYASHI HIROYUKI·Filed 2013·Application pending·0 cites
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