Assignee
GERSTEL SYSTEMTECHNIK GMBH
DE·9 granted patents·2 pending applications·138 citations·filing 2001–2015
Top patents by PatentIndex Score
11 records- 0190US7712385B2Method for the preparation of samples for an analyzer and sampling station thereforGERSTEL SYSTEMTECHNIK GMBH·Filed 2006·Granted May 11, 2010·18 cites·22 claims
- 0287US6907796B2Temperature-controlled injector for a chemical analysis unitGERSTEL SYSTEMTECHNIK GMBH·Filed 2002·Granted Jun 21, 2005·36 cites·13 claims
- 0380US7350427B2Sorbent collector material based on polyorganosiloxaneGERSTEL SYSTEMTECHNIK GMBH·Filed 2005·Granted Apr 1, 2008·7 cites·17 claims
- 0480US6815216B2Method for solid-phase microextraction and analysis, and a collector for this methodGERSTEL SYSTEMTECHNIK GMBH·Filed 2001·Granted Nov 9, 2004·24 cites·46 claims
- 0577US7530258B2Method for the preparation of samples for an analyzer and sample preparation station thereforGERSTEL SYSTEMTECHNIK GMBH·Filed 2006·Granted May 12, 2009·7 cites·23 claims
- 0676US7127956B2Method of sample delivery for a sample analyzer and liner handling systemGERSTEL SYSTEMTECHNIK GMBH·Filed 2005·Granted Oct 31, 2006·5 cites·1 claims
- 0775US6973846B2Sample handling device for an analytical instrumentGERSTEL SYSTEMTECHNIK GMBH·Filed 2003·Granted Dec 13, 2005·13 cites·20 claims
- 0871US6761056B2Process and device for producing a gas mixture which contains at least one gaseous component, in particular for producing a calibration gasGERSTEL SYSTEMTECHNIK GMBH·Filed 2002·Granted Jul 13, 2004·23 cites·30 claims
- 0963US7157055B2Apparatus for sample handling for an injection system of a chromatographGERSTEL SYSTEMTECHNIK GMBH·Filed 2003·Granted Jan 2, 2007·5 cites·15 claims
- 1051US2015309064A1Device for automatic samplingGERSTEL SYSTEMTECHNIK GMBH·Filed 2015·Application pending·0 cites
- 1147US2005032237A1Method for solid-phase microextraction and analysis, and a collector for this methodGERSTEL SYSTEMTECHNIK GMBH·Filed 2004·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →