Assignee
FUKAMI IKUO
JP·5 granted patents·36 citations·filing 2009–2011
Top patents by PatentIndex Score
5 records- 0187US8780517B2Semiconductor apparatus and temperature detection circuitFUKAMI IKUO·Filed 2010·Granted Jul 15, 2014·11 cites·12 claims
- 0284US8243407B2Semiconductor switch control deviceFUKAMI IKUO·Filed 2009·Granted Aug 14, 2012·14 cites·5 claims
- 0381US8717058B2Semiconductor apparatus and method of detecting characteristic degradation of semiconductor apparatusFUKAMI IKUO·Filed 2010·Granted May 6, 2014·5 cites·10 claims
- 0471US8531170B2Semiconductor deviceFUKAMI IKUO·Filed 2011·Granted Sep 10, 2013·4 cites·18 claims
- 0561US8405451B2Current source circuit and semiconductor deviceFUKAMI IKUO·Filed 2011·Granted Mar 26, 2013·2 cites·8 claims
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