Assignee
FIDELICA MICROSYSTEMS INC
US·17 granted patents·523 citations·filing 2000–2005
Top patents by PatentIndex Score
17 records- 0197US6672174B2Fingerprint image capture device with a passive sensor arrayFIDELICA MICROSYSTEMS INC·Filed 2001·Granted Jan 6, 2004·127 cites·38 claims
- 0296US7290323B2Method for manufacturing sensing devices to image textured surfacesFIDELICA MICROSYSTEMS INC·Filed 2003·Granted Nov 6, 2007·101 cites·34 claims
- 0393US7077010B2Magnetoresistive semiconductor pressure sensors and fingerprint identification/verification sensors using sameFIDELICA MICROSYSTEMS INC·Filed 2005·Granted Jul 18, 2006·23 cites·5 claims
- 0490US6889565B2Fingerprint sensors using membrane switch arraysFIDELICA MICROSYSTEMS INC·Filed 2001·Granted May 10, 2005·81 cites·56 claims
- 0587US6694822B1Use of multi-layer thin films as stress sensorFIDELICA MICROSYSTEMS INC·Filed 2000·Granted Feb 24, 2004·43 cites·19 claims
- 0683US6578436B1Method and apparatus for pressure sensingFIDELICA MICROSYSTEMS INC·Filed 2000·Granted Jun 17, 2003·48 cites·95 claims
- 0779US7316167B2Method and apparatus for protection of contour sensing devicesFIDELICA MICROSYSTEMS INC·Filed 2005·Granted Jan 8, 2008·14 cites·15 claims
- 0878US7073397B2Magnetoresistive semiconductor pressure sensors and fingerprint identification/verification sensors using sameFIDELICA MICROSYSTEMS INC·Filed 2005·Granted Jul 11, 2006·9 cites·1 claims
- 0970US6889555B1Magnetoresistive semiconductor pressure sensors and fingerprint identification/verification sensors using sameFIDELICA MICROSYSTEMS INC·Filed 2000·Granted May 10, 2005·11 cites·43 claims
- 1069US6612161B1Atomic force microscopy measurements of contact resistance and current-dependent stictionFIDELICA MICROSYSTEMS INC·Filed 2002·Granted Sep 2, 2003·15 cites·22 claims
- 1167US7059201B2Use of multi-layer thin films as stress sensorsFIDELICA MICROSYSTEMS INC·Filed 2000·Granted Jun 13, 2006·22 cites·85 claims
- 1267US6829950B2Method and apparatus for pressure sensingFIDELICA MICROSYSTEMS INC·Filed 2002·Granted Dec 14, 2004·17 cites·5 claims
- 1358US6912894B2Atomic force microscopy measurements of contact resistance and current-dependent stictionFIDELICA MICROSYSTEMS INC·Filed 2003·Granted Jul 5, 2005·4 cites·9 claims
- 1455US6871559B2Atomic force microscopy measurements of contact resistance and current-dependent stictionFIDELICA MICROSYSTEMS INC·Filed 2003·Granted Mar 29, 2005·3 cites·9 claims
- 1551US6832508B2Atomic force microscopy measurements of contact resistance and current-dependent stictionFIDELICA MICROSYSTEMS INC·Filed 2003·Granted Dec 21, 2004·2 cites·5 claims
- 1651US6761074B2Atomic force microscopy measurements of contact resistance and current-dependent stictionFIDELICA MICROSYSTEMS INC·Filed 2003·Granted Jul 13, 2004·2 cites·7 claims
- 1737US6981407B2Atomic force microscopy measurements of contact resistance and current-dependent stictionFIDELICA MICROSYSTEMS INC·Filed 2003·Granted Jan 3, 2006·1 cites·19 claims
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