Assignee
DANSK FUNDAMENTAL METROLOGI AS
DK·1 granted patent·1 pending application·11 citations·filing 2003–2023
Top patents by PatentIndex Score
2 records- 0158US7321433B2Method and apparatus for optically measuring the topography of nearly planar periodic structuresDANSK FUNDAMENTAL METROLOGI AS·Filed 2003·Granted Jan 22, 2008·11 cites·48 claims
- 0257US2023408432A1Non-contact impedance analyzer for real-time detection of microbial growthDANSK FUNDAMENTAL METROLOGI AS·Filed 2023·Application pending·0 cites
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