Assignee
COVENTOR INC
US·24 granted patents·11 pending applications·204 citations·filing 2000–2023
Top patents by PatentIndex Score
35 records- 0196US11158368B2Static random-access memory cell designCOVENTOR INC·Filed 2020·Granted Oct 26, 2021·5 cites·17 claims
- 0296US9659126B2Modeling pattern dependent effects for a 3-D virtual semiconductor fabrication environmentCOVENTOR INC·Filed 2015·Granted May 23, 2017·12 cites·28 claims
- 0395US9965577B2System and method for performing directed self-assembly in a 3-D virtual fabrication environmentCOVENTOR INC·Filed 2016·Granted May 8, 2018·10 cites·24 claims
- 0493US11144701B2System and method for key parameter identification, process model calibration and variability analysis in a virtual semiconductor device fabrication environmentCOVENTOR INC·Filed 2018·Granted Oct 12, 2021·15 cites·27 claims
- 0590US11861289B2System and method for performing process model calibration in a virtual semiconductor device fabrication environmentCOVENTOR INC·Filed 2021·Granted Jan 2, 2024·2 cites·17 claims
- 0690US10242142B2Predictive 3-D virtual fabrication system and methodCOVENTOR INC·Filed 2013·Granted Mar 26, 2019·12 cites·19 claims
- 0790US8959464B2Multi-etch process using material-specific behavioral parameters in 3-D virtual fabrication environmentCOVENTOR INC·Filed 2013·Granted Feb 17, 2015·14 cites·25 claims
- 0889US8832620B1Rule checks in 3-D virtual fabrication environmentCOVENTOR INC·Filed 2013·Granted Sep 9, 2014·23 cites·20 claims
- 0986US9317632B2System and method for modeling epitaxial growth in a 3-D virtual fabrication environmentCOVENTOR INC·Filed 2013·Granted Apr 19, 2016·11 cites·17 claims
- 1084US7131105B2System and method for automatic mesh generation from a system-level MEMS designCOVENTOR INC·Filed 2003·Granted Oct 31, 2006·42 cites·59 claims
- 1177US11630937B2System and method for predictive 3-D virtual fabricationCOVENTOR INC·Filed 2021·Granted Apr 18, 2023·0 cites·20 claims
- 1277US10762267B2System and method for electrical behavior modeling in a 3D virtual fabrication environmentCOVENTOR INC·Filed 2017·Granted Sep 1, 2020·4 cites·20 claims
- 1376US12475297B2System and method for performing process model calibration in a virtual semiconductor device fabrication environmentCOVENTOR INC·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 1473US7263674B2System and method for three-dimensional visualization and postprocessing of a system modelCOVENTOR INC·Filed 2003·Granted Aug 28, 2007·19 cites·55 claims
- 1572US6542829B1Characterization of microelectromechanical structuresCOVENTOR INC·Filed 2000·Granted Apr 1, 2003·18 cites·13 claims
- 1668US11074388B2System and method for predictive 3-D virtual fabricationCOVENTOR INC·Filed 2019·Granted Jul 27, 2021·0 cites·20 claims
- 1768US11048847B2System and method for performing a multi-etch process using material-specific behavioral parameters in a 3-D virtual fabrication environmentCOVENTOR INC·Filed 2019·Granted Jun 29, 2021·0 cites·21 claims
- 1868US7272801B1System and method for process-flexible MEMS design and simulationCOVENTOR INC·Filed 2004·Granted Sep 18, 2007·16 cites·25 claims
- 1960US12086520B2System and method for multi-material mesh generation from fill-fraction voxel dataCOVENTOR INC·Filed 2019·Granted Sep 10, 2024·1 cites·23 claims
- 2060US11620431B2System and method for performing depth-dependent oxidation modeling in a virtual fabrication environmentCOVENTOR INC·Filed 2022·Granted Apr 4, 2023·0 cites·22 claims
- 2156US11301613B2Systems and methods for performing depth-dependent oxidation modeling and depth-dependent etch modeling in a virtual fabrication environmentCOVENTOR INC·Filed 2020·Granted Apr 12, 2022·0 cites·18 claims
- 2251US2025164965A1System and method for performing 3d photoresist profile generationCOVENTOR INC·Filed 2023·Application pending·0 cites
- 2347US2020334397A1System and method for 2d to 3d model creation for a mems deviceCOVENTOR INC·Filed 2020·Application pending·0 cites
- 2447US2023252211A1Systems and methods for determining specification limits in a semiconductor device virtual fabrication environmentCOVENTOR INC·Filed 2021·Application pending·0 cites
- 2546US2025005221A1System and method for performing hole profile modeling in a virtual fabrication environmentCOVENTOR INC·Filed 2022·Application pending·0 cites
- 2645US12596300B2System and method for performing local CDU modeling and control in a virtual fabrication environmentCOVENTOR INC·Filed 2021·Granted Apr 7, 2026·0 cites·21 claims
- 2745US10885253B2System and method for determining dimensional range of repairable defects by deposition and etching in a virtual fabrication environmentCOVENTOR INC·Filed 2019·Granted Jan 5, 2021·0 cites·21 claims
- 2844US2003077570A1Small molecule substrate based enzyme activity assaysCOVENTOR INC·Filed 2001·Application pending·0 cites
- 2943US2002197733A1Microfluidic system including a virtual wall fluid interface port for interfacing fluids with the microfluidic systemCOVENTOR INC·Filed 2001·Application pending·0 cites
- 3043US2002195343A1Microfabricated separation device employing a virtual wall for interfacing fluidsCOVENTOR INC·Filed 2002·Application pending·0 cites
- 3143US2003015425A1Microfluidic system including a virtual wall fluid interface port for interfacing fluids with the microfluidic systemCOVENTOR INC·Filed 2001·Application pending·0 cites
- 3242US12423486B2System and method for process window optimization in a virtual semiconductor device fabrication environmentCOVENTOR INC·Filed 2020·Granted Sep 23, 2025·0 cites·22 claims
- 3342US2006173658A1System and method for numerically exploiting symmetry when using the boundary element method to perform computer-aided engineeringCOVENTOR INC·Filed 2005·Application pending·0 cites
- 3441US2022382953A1System and method for performing reflow modeling in a virtual fabrication environmentCOVENTOR INC·Filed 2020·Application pending·0 cites
- 3537US2023409775A1System and method for performing deformation and stress analysis modeling in a virtual fabrication environmentCOVENTOR INC·Filed 2021·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →