Assignee
CERPROBE CORP
US·13 granted patents·1,465 citations·filing 1977–2000
Top patents by PatentIndex Score
13 records- 0194US5828226AProbe card assembly for high density integrated circuitsCERPROBE CORP·Filed 1996·Granted Oct 27, 1998·231 cites·11 claims
- 0293US6559665B1Test socket for an IC deviceCERPROBE CORP·Filed 2000·Granted May 6, 2003·82 cites·13 claims
- 0393US6297654B1Test socket and method for testing an IC device in a dead bug orientationCERPROBE CORP·Filed 2000·Granted Oct 2, 2001·73 cites·24 claims
- 0493US5923178AProbe assembly and method for switchable multi-DUT testing of integrated circuit wafersCERPROBE CORP·Filed 1997·Granted Jul 13, 1999·145 cites·8 claims
- 0593US4161692AProbe device for integrated circuit wafersCERPROBE CORP·Filed 1977·Granted Jul 17, 1979·207 cites·12 claims
- 0692US6208155B1Probe tip and method for making electrical contact with a solder ball contact of an integrated circuit deviceCERPROBE CORP·Filed 1998·Granted Mar 27, 2001·118 cites·16 claims
- 0790US6220870B1IC chip socket and methodCERPROBE CORP·Filed 1998·Granted Apr 24, 2001·73 cites·17 claims
- 0888US5382898AHigh density probe card for testing electrical circuitsCERPROBE CORP·Filed 1992·Granted Jan 17, 1995·183 cites·13 claims
- 0986US6002426AInverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuitsCERPROBE CORP·Filed 1997·Granted Dec 14, 1999·168 cites·19 claims
- 1081US6114869AMethod and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cardsCERPROBE CORP·Filed 1998·Granted Sep 5, 2000·68 cites·16 claims
- 1173US5066907AProbe system for device and circuit testingCERPROBE CORP·Filed 1990·Granted Nov 19, 1991·48 cites·7 claims
- 1270US6354859B1Cover assembly for an IC socketCERPROBE CORP·Filed 1999·Granted Mar 12, 2002·41 cites·2 claims
- 1366US6426637B1Alignment guide and signal transmission apparatus and method for spring contact probe needlesCERPROBE CORP·Filed 1999·Granted Jul 30, 2002·28 cites·40 claims
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