Assignee
BAST ULRICH
0 granted patents·2 pending applications·0 citations·filing 2004–2005
Top patents by PatentIndex Score
2 records- 0152US2005229847A1Method and device for in situ layer thickness determinationBAST ULRICH·Filed 2005·Application pending·0 cites
- 0242US2006177676A1Heat-insulation material and arrangement of a heat-insulation layer containing said heat-insulation materialBAST ULRICH·Filed 2004·Application pending·0 cites
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