Assignee
AUERBACH DITZA
IL·3 granted patents·38 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0189US8255172B2Wafer defect detection system and methodAUERBACH DITZA·Filed 2009·Granted Aug 28, 2012·22 cites·22 claims
- 0277US8553970B2System and method for generating spatial signaturesAUERBACH DITZA·Filed 2012·Granted Oct 8, 2013·7 cites·17 claims
- 0371US8254661B2System and method for generating spatial signaturesAUERBACH DITZA·Filed 2009·Granted Aug 28, 2012·9 cites·44 claims
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