Assignee
AL-BAYATI AMIR
0 granted patents·3 pending applications·0 citations·filing 2006–2011
Top patents by PatentIndex Score
3 records- 0152US2007288116A1Method, system and medium for controlling semiconductor wafer processes using critical dimension measurementsAL-BAYATI AMIR·Filed 2007·Application pending·0 cites
- 0247US2011104891A1Methods and apparatus of creating airgap in dielectric layers for the reduction of rc delayAL-BAYATI AMIR·Filed 2011·Application pending·0 cites
- 0343US2007042580A1Ion implanted insulator material with reduced dielectric constantAL-BAYATI AMIR·Filed 2006·Application pending·0 cites
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