Assignee
ACTIVE LAYER PARAMETRICS INC
US·4 granted patents·1 pending application·2 citations·filing 2017–2024
Top patents by PatentIndex Score
5 records- 0187US11699622B2Methods and apparatus for test pattern forming and film property measurementACTIVE LAYER PARAMETRICS INC·Filed 2022·Granted Jul 11, 2023·1 cites·8 claims
- 0279US11289386B2Methods and apparatus for test pattern forming and film property measurementACTIVE LAYER PARAMETRICS INC·Filed 2020·Granted Mar 29, 2022·1 cites·13 claims
- 0359US12313669B2Methods and tools for electrical property depth profiling using electro-etchingACTIVE LAYER PARAMETRICS INC·Filed 2023·Granted May 27, 2025·0 cites·24 claims
- 0459US2026005073A1Methods for electrical property depth profiling through films with graded compositionACTIVE LAYER PARAMETRICS INC·Filed 2024·Application pending·0 cites
- 0538US10790203B2Methods and systems for material property profiling of thin filmsACTIVE LAYER PARAMETRICS INC·Filed 2017·Granted Sep 29, 2020·0 cites·18 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →