Assignee
4D SENSOR INC
JP·3 granted patents·9 citations·filing 2014–2016
Top patents by PatentIndex Score
3 records- 0173US10551177B2Apparatus and method for measuring 3D form or deformation of an object surface using a grid pattern and reference plane4D SENSOR INC·Filed 2016·Granted Feb 4, 2020·5 cites·9 claims
- 0265US10267626B2Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded4D SENSOR INC·Filed 2014·Granted Apr 23, 2019·4 cites·8 claims
- 0337US9891042B2Measurement method, measurement apparatus, measurement program and computer readable recording medium in which measurement program has been recorded4D SENSOR INC·Filed 2014·Granted Feb 13, 2018·0 cites·8 claims
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