Inventor · disambiguated record
Muhammad A. Afzal
Also filed as: AFZAL MUHAMMAD A · AFZAL MUHAMMAD AKBAR KHAN
9 granted patents·2 pending applications·66 citations·filing 2002–2012
86Inventor score
Files withTOLLGRADE COMMUNICATIONS INC5AFZAL MUHAMMAD A2FAULKNER ROGER2AFZAL MUHAMMAD AKBAR KHAN1TERADYNE INC1
Top patents by PatentIndex Score
11 records- 0178US9647454B2Methods and apparatus for determining conditions of power linesAFZAL MUHAMMAD A·Filed 2012·Granted May 9, 2017·9 cites·23 claims
- 0275US6826258B2System and method for pre-qualification of telephone lines for DSL service using an average loop lossTERADYNE INC·Filed 2002·Granted Nov 30, 2004·21 cites·20 claims
- 0374US8948018B2Integrated ethernet over coaxial cable, STB, and physical layer test and monitoringAFZAL MUHAMMAD A·Filed 2011·Granted Feb 3, 2015·5 cites·25 claims
- 0470US7602885B2Automatic provisioning of a telephone line test systemTOLLGRADE COMMUNICATIONS INC·Filed 2005·Granted Oct 13, 2009·6 cites·17 claims
- 0570US7529347B2Test system for assessing DSL capability of telephone linesTOLLGRADE COMMUNICATIONS INC·Filed 2004·Granted May 5, 2009·10 cites·20 claims
- 0669US7515691B2Method for testing DSL capability of telephone linesTOLLGRADE COMMUNICATIONS INC·Filed 2004·Granted Apr 7, 2009·12 cites·37 claims
- 0754US7653180B2Method for assessing DSL capability of telephone linesTOLLGRADE COMMUNICATIONS INC·Filed 2004·Granted Jan 26, 2010·2 cites·25 claims
- 0853US7386039B2Method and apparatus for identifying faults in a broadband networkTOLLGRADE COMMUNICATIONS INC·Filed 2003·Granted Jun 10, 2008·1 cites·27 claims
- 0939US2012306895A1Home wiring test systems and methodFAULKNER ROGER·Filed 2012·Application pending·0 cites
- 1035US8923139B2System and method for making far end measurements for DSL diagnosticsAFZAL MUHAMMAD AKBAR KHAN·Filed 2008·Granted Dec 30, 2014·0 cites·22 claims
- 1135US2012307982A1Home wiring test system using frequency-based measurement techniquesFAULKNER ROGER·Filed 2012·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →