Inventor · disambiguated record
A. Nicholas Sporck
Also filed as: SPORCK A NICHOLAS · SPORCK A NICHOLAS JR
21 granted patents·1 pending application·740 citations·filing 1996–2009
97Inventor score
Top patents by PatentIndex Score
22 records- 0199US6838893B2Probe card assemblyFORMFACTOR INC·Filed 2003·Granted Jan 4, 2005·155 cites·19 claims
- 0298US6856150B2Probe card with coplanar daughter cardFORMFACTOR INC·Filed 2001·Granted Feb 15, 2005·132 cites·55 claims
- 0397US7285968B2Apparatus and method for managing thermally induced motion of a probe card assemblyFORMFACTOR INC·Filed 2005·Granted Oct 23, 2007·77 cites·33 claims
- 0494US7952375B2AC coupled parameteric test probeFORMFACTOR INC·Filed 2006·Granted May 31, 2011·25 cites·20 claims
- 0592US7230437B2Mechanically reconfigurable vertical tester interface for IC probingFORMFACTOR INC·Filed 2004·Granted Jun 12, 2007·47 cites·19 claims
- 0691US7550842B2Integrated circuit assemblyFORMFACTOR INC·Filed 2002·Granted Jun 23, 2009·66 cites·21 claims
- 0790US7548055B2Testing an electronic device using test data from a plurality of testersFORMFACTOR INC·Filed 2007·Granted Jun 16, 2009·12 cites·5 claims
- 0889US7592821B2Apparatus and method for managing thermally induced motion of a probe card assemblyFORMFACTOR INC·Filed 2007·Granted Sep 22, 2009·11 cites·23 claims
- 0989US7202687B2Systems and methods for wireless semiconductor device testingFORMFACTOR INC·Filed 2004·Granted Apr 10, 2007·34 cites·27 claims
- 1087US7852094B2Sharing resources in a system for testing semiconductor devicesFORMFACTOR INC·Filed 2006·Granted Dec 14, 2010·13 cites·18 claims
- 1187US7061257B2Probe card assemblyFORMFACTOR INC·Filed 2004·Granted Jun 13, 2006·25 cites·46 claims
- 1286US7218094B2Wireless test systemFORMFACTOR INC·Filed 2003·Granted May 15, 2007·28 cites·22 claims
- 1384US7649366B2Method and apparatus for switching tester resourcesFORMFACTOR INC·Filed 2006·Granted Jan 19, 2010·13 cites·22 claims
- 1483US7064566B2Probe card assembly and kitFORMFACTOR INC·Filed 1998·Granted Jun 20, 2006·36 cites·14 claims
- 1582US7352196B2Probe card assembly and kitFORMFACTOR INC·Filed 2006·Granted Apr 1, 2008·6 cites·24 claims
- 1681US7821255B2Test system with wireless communicationsFORMFACTOR INC·Filed 2009·Granted Oct 26, 2010·5 cites·14 claims
- 1780US7659736B2Mechanically reconfigurable vertical tester interface for IC probingFORMFACTOR INC·Filed 2007·Granted Feb 9, 2010·8 cites·13 claims
- 1880US7616016B2Probe card assembly and kitFORMFACTOR INC·Filed 2008·Granted Nov 10, 2009·5 cites·15 claims
- 1978US7675311B2Wireless test systemFORMFACTOR INC·Filed 2007·Granted Mar 9, 2010·7 cites·18 claims
- 2069US5867033ACircuit for testing the operation of a semiconductor deviceLSI LOGIC CORP·Filed 1996·Granted Feb 2, 1999·31 cites·29 claims
- 2157US2010000080A1Apparatus and method for managing thermally induced motion of a probe card assemblyFORMFACTOR INC·Filed 2009·Application pending·0 cites
- 2226US5646406AStroboscopic photometerLSI LOGIC CORP·Filed 1996·Granted Jul 8, 1997·4 cites·23 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →