Inventor · disambiguated record
Hirotaka Wagata
Also filed as: WAGATA HIROTAKA
5 granted patents·91 citations·filing 2000–2012
80Inventor score
Top patents by PatentIndex Score
5 records- 0190US6421624B1Multi-port device analysis apparatus and method and calibration method thereofADVANTEST CORP·Filed 2000·Granted Jul 16, 2002·57 cites·21 claims
- 0272US7359814B1Multi-port analysis apparatus and method and calibration method thereofADVANTEST·Filed 2000·Granted Apr 15, 2008·21 cites·22 claims
- 0367US9583854B2Connector and semiconductor testing device having the sameUESAKA RYO·Filed 2011·Granted Feb 28, 2017·6 cites·18 claims
- 0462US8558568B2Connector and semiconductor testing device using the sameUESAKA RYO·Filed 2011·Granted Oct 15, 2013·4 cites·15 claims
- 0552US8657625B2Connector and semiconductor test deviceWAGATA HIROTAKA·Filed 2012·Granted Feb 25, 2014·3 cites·13 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →