Inventor · disambiguated record
Youji Terauchi
Also filed as: TERAUCHI YOUJI
9 granted patents·1 pending application·119 citations·filing 1997–2010
86Inventor score
Top patents by PatentIndex Score
10 records- 0175US6211715B1Semiconductor integrated circuit incorporating therein clock supply circuitNEC CORP·Filed 1998·Granted Apr 3, 2001·80 cites·32 claims
- 0263US8041880B2Flash memory, memory control circuit, microcomputer and memory control methodRENESAS ELECTRONICS CORP·Filed 2006·Granted Oct 18, 2011·3 cites·27 claims
- 0356US5862147ASemiconductor device on semiconductor wafer having simple wirings for test and capable of being tested in a short timeNEC CORP·Filed 1997·Granted Jan 19, 1999·23 cites·20 claims
- 0454US8335113B2Flash memory and data erasing method of the sameTERAUCHI YOUJI·Filed 2010·Granted Dec 18, 2012·2 cites·6 claims
- 0547US2010083073A1Data processing apparatus, memory controlling circuit, and memory controlling methodNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 0646US7596036B2Memory control circuit, microcomputer, and data rewriting methodNEC ELECTRONICS CORP·Filed 2007·Granted Sep 29, 2009·2 cites·20 claims
- 0742US7136771B2Semiconductor device and testing circuit which can carries out a verifying test effectively for non-volatile memory cellsNEC ELECTRONICS CORP·Filed 2004·Granted Nov 14, 2006·4 cites·8 claims
- 0833US8117509B2Memory control circuit, semiconductor integrated circuit, and verification method of nonvolatile memoryTERAUCHI YOUJI·Filed 2008·Granted Feb 14, 2012·0 cites·26 claims
- 0929US6397342B1Device with a clock output circuitNEC CORP·Filed 1999·Granted May 28, 2002·3 cites·8 claims
- 1028US5905907AMicrocomputer loaded with PROM and data read-out testing method for sameNEC CORP·Filed 1997·Granted May 18, 1999·2 cites·8 claims
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