Inventor · disambiguated record
Huy T. Vo
Also filed as: VO HUY · VO HUY T · VO HUY THANH
77 granted patents·6 pending applications·1,425 citations·filing 1990–2024
99Inventor score
Top patents by PatentIndex Score
83 records- 0199US6166942AEmbedded DRAM architecture with local data drivers and programmable number of data read and data write linesMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 26, 2000·484 cites·42 claims
- 0295US11074956B1Arbitrated sense amplifierMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 27, 2021·5 cites·23 claims
- 0392US11594272B2Sensing a memory cellMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 28, 2023·2 cites·20 claims
- 0492US10026462B1Apparatuses and methods for providing constant DQS-DQ delay in a memory deviceMICRON TECHNOLOGY INC·Filed 2017·Granted Jul 17, 2018·9 cites·19 claims
- 0591US11967362B2Pre-sense gut node amplification in sense amplifierMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 23, 2024·2 cites·21 claims
- 0690US6484278B1Method and apparatus for testing an embedded DRAMMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 19, 2002·47 cites·36 claims
- 0789US6141286AEmbedded DRAM architecture with local data drivers and programmable number of data read and data write linesMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 31, 2000·65 cites·70 claims
- 0889US6005813ADevice and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 21, 1999·51 cites·11 claims
- 0987US9922686B2Apparatuses and methods for performing intra-module databus inversion operationsMICRON TECHNOLOGY INC·Filed 2016·Granted Mar 20, 2018·7 cites·24 claims
- 1086US10297294B2Apparatuses and methods for performing intra-module databus inversion operationsMICRON TECHNOLOGY INC·Filed 2017·Granted May 21, 2019·6 cites·20 claims
- 1186US6930503B2System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 16, 2005·28 cites·40 claims
- 1285US6809986B2System and method for negative word line driver circuitMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 26, 2004·34 cites·102 claims
- 1385US6496027B1System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 17, 2002·50 cites·23 claims
- 1485US6072737AMethod and apparatus for testing embedded DRAMMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 6, 2000·67 cites·65 claims
- 1585US5097381ADouble sidewall trench capacitor cellMICRON TECHNOLOGY INC·Filed 1990·Granted Mar 17, 1992·59 cites·25 claims
- 1682US9225322B2Apparatuses and methods for providing clock signalsMICRON TECHNOLOGY INC·Filed 2013·Granted Dec 29, 2015·4 cites·21 claims
- 1782US6756805B2System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 29, 2004·23 cites·24 claims
- 1882US6345006B1Memory circuit with local isolation and pre-charge circuitsMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 5, 2002·32 cites·110 claims
- 1981US8342763B2Portable printer with ribbon cartridge retaining featureZIH CORP·Filed 2009·Granted Jan 1, 2013·12 cites·16 claims
- 2080US8060391B2Analogy based workflow identificationFREIRE JULIANA·Filed 2007·Granted Nov 15, 2011·10 cites·9 claims
- 2179US8762186B2Analogy based workflow identificationFREIRE JULIANA·Filed 2011·Granted Jun 24, 2014·4 cites·20 claims
- 2279US8499187B2Methods and apparatuses for master-slave detectionKIM KANG-YONG·Filed 2011·Granted Jul 30, 2013·4 cites·26 claims
- 2376US10755756B2Apparatuses and methods for providing constant DQS-DQ delay in a memory deviceMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 25, 2020·2 cites·20 claims
- 2476US6434066B1Device and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 13, 2002·15 cites·22 claims
- 2574US8164975B2Data capture system and method, and memory controllers and devicesVO HUY·Filed 2009·Granted Apr 24, 2012·7 cites·25 claims
- 2674US6125067ADevice and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 26, 2000·22 cites·11 claims
- 2773US6077211ACircuits and methods for selectively coupling redundant elements into an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 20, 2000·28 cites·32 claims
- 2872US8190633B2Enabling provenance management for pre-existing applicationsFREIRE JULIANA·Filed 2008·Granted May 29, 2012·7 cites·17 claims
- 2971US11127449B2Sensing a memory cellMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 21, 2021·2 cites·11 claims
- 3071US8913447B2Method and apparatus for memory command input and controlANDERSON JACOB ROBERT·Filed 2011·Granted Dec 16, 2014·3 cites·24 claims
- 3170US6574156B2Device and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 3, 2003·11 cites·22 claims
- 3268US11715508B2Source follower-based sensing schemeMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 3367US5592488AMethod and apparatus for pipelined multiplexing employing analog delays for a multiport interfaceMICRON TECHNOLOGY INC·Filed 1995·Granted Jan 7, 1997·26 cites·7 claims
- 3466US11134788B2Multi-stage memory sensingMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 5, 2021·0 cites·20 claims
- 3566US6333887B1Circuits and methods for selectively coupling redundant elements into an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 25, 2001·12 cites·28 claims
- 3666US6310804B1Device and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 30, 2001·9 cites·11 claims
- 3766US6275443B1Latched row or column select enable driverMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 14, 2001·12 cites·30 claims
- 3866US5680595AProgrammable data port clocking system for clocking a plurality of data ports with a plurality of clocking signals in an asynchronous transfer mode systemMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 21, 1997·25 cites·10 claims
- 3965US10932582B2Multi-stage memory sensingMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 2, 2021·0 cites·20 claims
- 4065US8862863B2Methods and apparatuses for master-slave detectionMICRON TECHNOLOGY INC·Filed 2013·Granted Oct 14, 2014·1 cites·20 claims
- 4165US5719890AMethod and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAMMICRON TECHNOLOGY INC·Filed 1995·Granted Feb 17, 1998·42 cites·3 claims
- 4264US11514969B2Arbitrated sense amplifierMICRON TECHNOLOGY INC·Filed 2021·Granted Nov 29, 2022·0 cites·20 claims
- 4364US11081158B2Source follower-based sensing schemeMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 3, 2021·0 cites·20 claims
- 4464US10636470B2Source follower-based sensing schemeMICRON TECHNOLOGY INC·Filed 2018·Granted Apr 28, 2020·1 cites·19 claims
- 4564US7570504B2Device and method to reduce wordline RC time constant in semiconductor memory devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 4, 2009·13 cites·3 claims
- 4664US5854800AMethod and apparatus for a high speed cyclical redundancy check systemMICRON TECHNOLOGY INC·Filed 1995·Granted Dec 29, 1998·39 cites·9 claims
- 4762US5778007AMethod and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAMMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 7, 1998·37 cites·10 claims
- 4861US10127971B1Systems and methods for memory cell array initializationMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 13, 2018·1 cites·15 claims
- 4961US5748635AMultiport datapath systemMICRON TECHNOLOGY INC·Filed 1996·Granted May 5, 1998·19 cites·12 claims
- 5060US10667621B2Multi-stage memory sensingMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 2, 2020·0 cites·25 claims
Showing the top 50 of 83 patent records by PatentIndex Score.
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