Inventor · disambiguated record
Nobuyuki Iriki
Also filed as: IRIKI NOBUYUKI
7 granted patents·107 citations·filing 1989–2005
85Inventor score
Top patents by PatentIndex Score
7 records- 0172US6716648B2Method of manufacturing and testing semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2001·Granted Apr 6, 2004·18 cites·40 claims
- 0271US5497331ASemiconductor integrated circuit device fabrication method and its fabrication apparatusHITACHI LTD·Filed 1994·Granted Mar 5, 1996·46 cites·8 claims
- 0369US5094539AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1989·Granted Mar 10, 1992·22 cites·18 claims
- 0453US5432608AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1993·Granted Jul 11, 1995·11 cites·51 claims
- 0549US6894790B2Micropattern shape measuring system and methodHITACHI HIGH TECH CORP·Filed 2002·Granted May 17, 2005·2 cites·4 claims
- 0647US7130063B2Micropattern shape measuring system and methodHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 31, 2006·0 cites·6 claims
- 0746US5260771AMethod of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in sameHITACHI LTD·Filed 1991·Granted Nov 9, 1993·8 cites·16 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →