Inventor · disambiguated record
Sang-Kil Lee
Also filed as: LEE SANG K · LEE SANG-KIL
65 granted patents·21 pending applications·260 citations·filing 1996–2025
98Inventor score
Files withSAMSUNG ELECTRONICS CO LTD47KOREA RES INST STANDARDS & SCI9CORENTEC CO LTD4KOLON INC3DREAMBIOGEN CO LTD2
Top patents by PatentIndex Score
86 records- 0190US10585151B2Squid sensor module and magnetoencephalography measuring apparatusKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Mar 10, 2020·4 cites·7 claims
- 0287US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0387US9733178B2Spectral ellipsometry measurement and data analysis device and related systems and methodsSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 15, 2017·3 cites·16 claims
- 0487US9659743B2Image creating method and imaging system for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted May 23, 2017·4 cites·20 claims
- 0584US9333438B2Block studying tool for infantLEE SANG KIL·Filed 2015·Granted May 10, 2016·8 cites·4 claims
- 0684US9036895B2Method of inspecting waferSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted May 19, 2015·6 cites·20 claims
- 0783US9934939B2Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 3, 2018·5 cites·13 claims
- 0883US9831626B2Broadband light source and optical inspector having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Nov 28, 2017·2 cites·17 claims
- 0982US5732029AMethod and circuit for testing memory cells in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Mar 24, 1998·51 cites·10 claims
- 1081US8841824B2Broadband light illuminatorsSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Sep 23, 2014·5 cites·20 claims
- 1181US6780607B2Method for cell-free protein complete post-translational modificationDREAMBIOGEN CO LTD·Filed 2001·Granted Aug 24, 2004·18 cites·9 claims
- 1279US9123503B2Methods of fabricating microelectronic substrate inspection equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 1, 2015·3 cites·9 claims
- 1379US8960714B2Side curtain airbag and airbag system comprising the sameKOLON INC·Filed 2013·Granted Feb 24, 2015·7 cites·11 claims
- 1477US9823312B2Apparatus and method for indirectly cooling superconducting quantum interference deviceKOREA RES INST STANDARDS & SCI·Filed 2015·Granted Nov 21, 2017·3 cites·15 claims
- 1577US9261532B1Conductive atomic force microscope and method of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 16, 2016·2 cites·20 claims
- 1677US7698615B2Semiconductor memory device having single-level cells and multi-level cells and method of driving the semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 13, 2010·11 cites·17 claims
- 1776US2025176886A1Multimodal position transformation dual-helmet meg apparatusKOREA RES INST STANDARDS & SCI·Filed 2025·Application pending·0 cites
- 1874US12245858B2Multimodal position transformation dual-helmet MEG apparatusKOREA RES INST STANDARDS & SCI·Filed 2022·Granted Mar 11, 2025·0 cites·38 claims
- 1974US8409586B2Stable liquid formulation of human growth hormoneKIM SUN HEE·Filed 2006·Granted Apr 2, 2013·2 cites·4 claims
- 2074US6912056B2Apparatus and method for measuring each thickness of a multilayer stacked on a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 28, 2005·19 cites·29 claims
- 2173US10373796B2Method of inspecting wafer using electron beamSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 6, 2019·2 cites·20 claims
- 2273US9455206B2Overlay measuring method and system, and method of manufacturing semiconductor device using the sameYUN SEONG-JIN·Filed 2015·Granted Sep 27, 2016·2 cites·10 claims
- 2372US8703405B2Methods of generating three-dimensional process window qualificationSOHN YOUNG-HOON·Filed 2012·Granted Apr 22, 2014·2 cites·20 claims
- 2472US7363441B2Portable storage apparatus and method for freely changing data bus widthSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 22, 2008·6 cites·15 claims
- 2569US8152354B2Light source unit, manufacturing method thereof, and display device having the sameHONG KI-HYUN·Filed 2008·Granted Apr 10, 2012·5 cites·23 claims
- 2667US11766204B2Multi-sensor magneto-monitoring-imaging systemTHE KOREA RES INSTITUTE OF STANDARDS AND SCIENCE “KRISS”·Filed 2018·Granted Sep 26, 2023·2 cites·13 claims
- 2767US10426363B2Magnetoencephalography measuring apparatusKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Oct 1, 2019·1 cites·16 claims
- 2867US8729468B2Microelectronic substrate inspection equipment using helium ion microscopyKIM MIN-KOOK·Filed 2012·Granted May 20, 2014·2 cites·11 claims
- 2966USD1016322SSterilization box for medical devicesCORENTEC CO LTD·Filed 2021·Granted Feb 27, 2024·4 cites·1 claims
- 3066US9196182B2Display deviceSAMSUNG DISPLAY CO LTD·Filed 2012·Granted Nov 24, 2015·1 cites·22 claims
- 3166US8902412B2Defect inspection apparatus and defect inspection method using the sameSOHN YOUNG-HOON·Filed 2012·Granted Dec 2, 2014·1 cites·19 claims
- 3265US11227647B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 18, 2022·0 cites·20 claims
- 3363US12350052B2Magnetocardiography measuring apparatusKOREA RES INST STANDARDS & SCI·Filed 2023·Granted Jul 8, 2025·0 cites·26 claims
- 3463US10878873B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Dec 29, 2020·0 cites·20 claims
- 3563US8759763B2Method and apparatus to measure step height of device using scanning electron microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Jun 24, 2014·1 cites·19 claims
- 3663US7468512B2Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profilesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 23, 2008·1 cites·4 claims
- 3762US8822358B2Polyester fabrics for airbag and preparation method thereofKIM JAE-HYUNG·Filed 2010·Granted Sep 2, 2014·1 cites·14 claims
- 3862US7091485B2Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profilesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 15, 2006·6 cites·8 claims
- 3961US2010253047A1Inflatable fabrics and an air-bagKOLON INC·Filed 2008·Application pending·0 cites
- 4059US12245857B2Dual-helmet magnetoencephalography apparatusKOREA RES INST STANDARDS & SCI·Filed 2022·Granted Mar 11, 2025·0 cites·32 claims
- 4158US7234031B2Portable storage apparatus and method for freely changing data bus widthSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 19, 2007·7 cites·12 claims
- 4257US12371736B2TD probe and its usesSEEGENE INC·Filed 2017·Granted Jul 29, 2025·0 cites·35 claims
- 4357US7923684B2Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profilesSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Apr 12, 2011·0 cites·16 claims
- 4455US10613160B2Cryocooled SQUID measurement apparatusKOREA RES INST STANDARDS & SCI·Filed 2017·Granted Apr 7, 2020·0 cites·22 claims
- 4555US2024415661A1Glenoid BaseplateCORENTEC CO LTD·Filed 2022·Application pending·0 cites
- 4655US2025134671A1Glenoid BaseplateCORENTEC CO LTD·Filed 2022·Application pending·0 cites
- 4755US2025367000A1Glenoid Baseplate and Manufacturing Method ThereofCORENTEC CO LTD·Filed 2022·Application pending·0 cites
- 4854US5818285AFuse signature circuits for microelectronic devicesSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Oct 6, 1998·15 cites·21 claims
- 4953US11984467B2Image sensor and image sensing deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 14, 2024·0 cites·19 claims
- 5053US9155697B2Stable liquid compositions for treating stomatitis comprising epidermal growth factorKIM SUN-HEE·Filed 2007·Granted Oct 13, 2015·0 cites·11 claims
Showing the top 50 of 86 patent records by PatentIndex Score.
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