Inventor · disambiguated record
Kheng Chok Tee
Also filed as: TEE KHENG CHOK
24 granted patents·655 citations·filing 1998–2015
96Inventor score
Files withCHARTERED SEMICONDUCTOR MFG18GLOBALFOUNDRIES SG PTE LTD4CHARTERED SEMICONDUCTOR MANU L1CHARTERED SEMICONDUCTOR MFG CO1
Top patents by PatentIndex Score
24 records- 0196US7169675B2Material architecture for the fabrication of low temperature transistorCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Jan 30, 2007·164 cites·49 claims
- 0290US6468906B1Passivation of copper interconnect surfaces with a passivating metal layerCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Oct 22, 2002·67 cites·17 claims
- 0387US6100195APassivation of copper interconnect surfaces with a passivating metal layerCHARTERED SEMICONDUCTOR MANU L·Filed 1998·Granted Aug 8, 2000·122 cites·18 claims
- 0485US7084025B2Selective oxide trimming to improve metal T-gate transistorCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Aug 1, 2006·39 cites·41 claims
- 0583US6410429B1Method for fabricating void-free epitaxial-CoSi2 with ultra-shallow junctionsCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted Jun 25, 2002·33 cites·15 claims
- 0680US6998682B2Method of forming a partially depleted silicon on insulator (PDSOI) transistor with a pad lock body extensionCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Feb 14, 2006·9 cites·22 claims
- 0777US7528445B2Wing gate transistor for integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted May 5, 2009·6 cites·8 claims
- 0877US7089522B2Device, design and method for a slot in a conductive areaCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted Aug 8, 2006·31 cites·41 claims
- 0975US6319772B1Method for making low-leakage DRAM structures using selective silicon epitaxial growth (SEG) on an insulating layerCHARTERED SEMICONDUCTOR MFG·Filed 2000·Granted Nov 20, 2001·14 cites·35 claims
- 1073US6268276B1Area array air gap structure for intermetal dielectric applicationCHARTERED SEMICONDUCTOR MFG·Filed 1998·Granted Jul 31, 2001·49 cites·35 claims
- 1172US9847272B2Three-dimensional integrated circuit structures providing thermoelectric cooling and methods for cooling such integrated circuit structuresGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Dec 19, 2017·3 cites·16 claims
- 1267US7314811B2Method to make corner cross-grid structures in copper metallizationCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Jan 1, 2008·15 cites·27 claims
- 1367US6384437B1Low-leakage DRAM structures using selective silicon epitaxial growth (SEG) on an insulating layerCHARTERED SEMICONDUCTOR MFG·Filed 2001·Granted May 7, 2002·9 cites·6 claims
- 1462US6150232AFormation of low k dielectricCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted Nov 21, 2000·28 cites·54 claims
- 1561US6730571B1Method to form a cross network of air gaps within IMD layerCHARTERED SEMICONDUCTOR MFG·Filed 1999·Granted May 4, 2004·23 cites·23 claims
- 1659US6905919B2Method of forming a partially depleted silicon on insulator (PDSOI) transistor with a pad lock body extensionCHARTERED SEMICONDUCTOR MFG·Filed 2003·Granted Jun 14, 2005·8 cites·22 claims
- 1753US6251798B1Formation of air gap structures for inter-metal dielectric applicationCHARTERED SEMICONDUCTOR MFG CO·Filed 1999·Granted Jun 26, 2001·21 cites·29 claims
- 1852US7112866B2Method to form a cross network of air gaps within IMD layerCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Sep 26, 2006·4 cites·4 claims
- 1951US7056799B2Method of forming wing gate transistor for integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Jun 6, 2006·4 cites·14 claims
- 2049US7238581B2Method of manufacturing a semiconductor device with a strained channelCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Jul 3, 2007·5 cites·20 claims
- 2144US9196544B2Integrated circuits with stressed semiconductor-on-insulator (SOI) body contacts and methods for fabricating the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2014·Granted Nov 24, 2015·0 cites·19 claims
- 2244US7888752B2Structure and method to form source and drain regions over doped depletion regionsGLOBALFOUNDRIES SG PTE LTD·Filed 2007·Granted Feb 15, 2011·0 cites·18 claims
- 2341US9837334B2Programmable active cooling deviceGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Dec 5, 2017·0 cites·20 claims
- 2437US7202133B2Structure and method to form source and drain regions over doped depletion regionsCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Apr 10, 2007·1 cites·27 claims
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