Inventor · disambiguated record
Tetsuya Kimijima
Also filed as: KIMIJIMA TETSUYA
14 granted patents·2 pending applications·165 citations·filing 1997–2010
92Inventor score
Top patents by PatentIndex Score
16 records- 0179US6605134B2Method and apparatus for collecting rare gasNIPPON OXYGEN CO LTD·Filed 2001·Granted Aug 12, 2003·29 cites·6 claims
- 0277US6823743B2Method and apparatus for measuring concentrations of components of fluidNIPPON OXYGEN CO LTD·Filed 2002·Granted Nov 30, 2004·13 cites·12 claims
- 0374US6857324B2Method and apparatus for measuring concentrations of components of fluidNIPPON OXYGEN CO LTD·Filed 2003·Granted Feb 22, 2005·10 cites·6 claims
- 0472US6397660B1Gas analyzing apparatusNIPPON OXYGEN CO LTD·Filed 2001·Granted Jun 4, 2002·9 cites·3 claims
- 0571US8597584B2Gas purifying process and deviceOHMI TADAHIRO·Filed 2010·Granted Dec 3, 2013·1 cites·3 claims
- 0671US6040915AAnalysis method for gases and apparatus thereforNIPPON OXYGEN CO LTD·Filed 1998·Granted Mar 21, 2000·40 cites·22 claims
- 0769US6717666B2Method and apparatus for measuring nitrogen in a gasNIPPON OXYGEN CO LTD·Filed 2002·Granted Apr 6, 2004·8 cites·19 claims
- 0867US6478040B1Gas supplying apparatus and gas substitution methodNIPPON OXYGEN CO LTD·Filed 2000·Granted Nov 12, 2002·9 cites·5 claims
- 0963US6550308B2Gas analyzing apparatusNIPPON OXYGEN CO LTD·Filed 2002·Granted Apr 22, 2003·4 cites·1 claims
- 1057US6418781B1System for analyzing trace amounts of impurities in gasesNIPPON OXYGEN CO LTD·Filed 1999·Granted Jul 16, 2002·13 cites·3 claims
- 1155US6324892B1Multi-gas analysis system for analyzing high-purity gasesNIPPON OXYGEN CO LTD·Filed 1999·Granted Dec 4, 2001·17 cites·11 claims
- 1243US7744836B2Gas purifying process and deviceTAIYO NIPPON SANSO CORP·Filed 2003·Granted Jun 29, 2010·0 cites·2 claims
- 1342US6000275AMethod for analyzing impurities in gas and its analyzerNIPPON OXYGEN CO LTD·Filed 1997·Granted Dec 14, 1999·8 cites·13 claims
- 1442US2002144535A1Method and apparatus for producing gas containing metal particles and for evaluating particle counter and particle trapperFiled 2002·Application pending·0 cites
- 1541US2002111747A1System and process for analysisFiled 2002·Application pending·0 cites
- 1633US6375911B1Method and device for treating exhaust gasNIPPON OXYGEN CO LTD·Filed 1998·Granted Apr 23, 2002·4 cites·5 claims
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