Inventor · disambiguated record
Marvin Tabasky
Also filed as: TABASKY MARVIN · TABASKY MARVIN J
20 granted patents·457 citations·filing 1981–2000
96Inventor score
Files withGTE LABORATORIES INC15CORNING APPLIED TECHNOLOGIES C2LAB INC1NZ APPLIED TECHNOLOGIES1NZ APPLIED TECHNOLOGIES INC1
Top patents by PatentIndex Score
20 records- 0193US6404495B1System and method for molecular sample measurementCORNING APPLIED TECHNOLOGIES C·Filed 2000·Granted Jun 11, 2002·54 cites·22 claims
- 0281US5163108AMethod and device for passive alignment of diode lasers and optical fibersGTE LABORATORIES INC·Filed 1991·Granted Nov 10, 1992·60 cites·19 claims
- 0379US5077878AMethod and device for passive alignment of diode lasers and optical fibersGTE LABORATORIES INC·Filed 1990·Granted Jan 7, 1992·53 cites·17 claims
- 0476US6084667ASystem and method for molecular sample measurementNZ APPLIED TECHNOLOGIES·Filed 1998·Granted Jul 4, 2000·49 cites·37 claims
- 0572US5182782AWaferboard structure and method of fabricatingGTE LABORATORIES INC·Filed 1992·Granted Jan 26, 1993·30 cites·7 claims
- 0671US4593459AMonolithic integrated circuit structure and method of fabricationGTE LABORATORIES INC·Filed 1984·Granted Jun 10, 1986·34 cites·12 claims
- 0760US6445448B1System and method for molecular sample measurementCORNING APPLIED TECHNOLOGIES C·Filed 1999·Granted Sep 3, 2002·19 cites·18 claims
- 0860US5268066AMethod of fabricating waferboard structureGTE LABORATORIES INC·Filed 1992·Granted Dec 7, 1993·16 cites·10 claims
- 0958US5903348ASystem and method for molecular sample measurementsNZ APPLIED TECHNOLOGIES INC·Filed 1997·Granted May 11, 1999·21 cites·28 claims
- 1058US4631806AMethod of producing integrated circuit structuresGTE LABORATORIES INC·Filed 1985·Granted Dec 30, 1986·26 cites·5 claims
- 1157US5045346AMethod of depositing fluorinated silicon nitrideGTE LABORATORIES INC·Filed 1990·Granted Sep 3, 1991·22 cites·16 claims
- 1256US5126805AJunction field effect transistor with SiGe contact regionsGTE LABORATORIES INC·Filed 1990·Granted Jun 30, 1992·18 cites·1 claims
- 1356US4983536AMethod of fabricating junction field effect transistorGTE LABORATORIES INC·Filed 1989·Granted Jan 8, 1991·16 cites·8 claims
- 1448US5436996AWaferboard structureGTE LABORATORIES INC·Filed 1994·Granted Jul 25, 1995·11 cites·9 claims
- 1537US5285090AContacts to rod shaped Schottky gate fetsGTE LABORATORIES INC·Filed 1992·Granted Feb 8, 1994·7 cites·19 claims
- 1636US4633290AMonolithic CMOS integrated circuit structure with isolation groovesGTE LABORATORIES INC·Filed 1986·Granted Dec 30, 1986·8 cites·5 claims
- 1731US5098862AMethod of making ohmic electrical contact to a matrix of semiconductor materialGTE LABORATORIES INC·Filed 1990·Granted Mar 24, 1992·3 cites·18 claims
- 1831US4693783AMethod of producing interconnections in a semiconductor integrated circuit structureGTE LABORATORIES INC·Filed 1984·Granted Sep 15, 1987·3 cites·9 claims
- 1931US4416055AMethod of fabricating a monolithic integrated circuit structureGTE LABORATORIES INC·Filed 1981·Granted Nov 22, 1983·5 cites·16 claims
- 2023US5021363AMethod of selectively producing conductive members on a semiconductor surfaceLAB INC·Filed 1989·Granted Jun 4, 1991·2 cites·4 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →