Inventor · disambiguated record
Zhao-Li Zhang
Also filed as: ZHANG ZHAO · Zhang zhao-li
13 granted patents·3 pending applications·92 citations·filing 2008–2023
89Inventor score
Files withASML NETHERLANDS BV3FANG WEI3HERMES MICROVISION INC2HONGFUJIN PREC IND WUHAN2CHEN SHIH-TSUNG1
Top patents by PatentIndex Score
16 records- 0191US8068662B2Method and system for determining a defect during charged particle beam inspection of a sampleZhang zhao-li·Filed 2009·Granted Nov 29, 2011·46 cites·19 claims
- 0286US9251581B1Methods for promoting semiconductor manufacturing yield and classifying defects during fabricating a semiconductor device, and computer readable mediums encoded with a computer program implementing the sameCHEN SHIH-TSUNG·Filed 2011·Granted Feb 2, 2016·14 cites·14 claims
- 0385US8712184B1Method and system for filtering noises in an image scanned by charged particlesLIAO CHAD·Filed 2011·Granted Apr 29, 2014·20 cites·18 claims
- 0483US10102619B1Inspection method and systemHERMES MICROVISION INC·Filed 2015·Granted Oct 16, 2018·4 cites·55 claims
- 0576US8606017B1Method for inspecting localized image and system thereofFANG WEI·Filed 2011·Granted Dec 10, 2013·7 cites·26 claims
- 0675US11880971B2Inspection method and systemASML NETHERLANDS BV·Filed 2022·Granted Jan 23, 2024·0 cites·20 claims
- 0770US11250559B2Inspection method and systemASML NETHERLANDS BV·Filed 2020·Granted Feb 15, 2022·0 cites·20 claims
- 0868US9965844B1Inspection method and systemHERMES MICROVISION INC·Filed 2016·Granted May 8, 2018·1 cites·23 claims
- 0963US10679340B2Inspection method and systemASML NETHERLANDS BV·Filed 2018·Granted Jun 9, 2020·0 cites·17 claims
- 1059US12150265B2SSD card adapter bracket and circuit board assemblyHONGFUJIN PREC IND WUHAN·Filed 2022·Granted Nov 19, 2024·0 cites·17 claims
- 1155US12026023B2Support assembly and chassis structure having the sameHONGFUJIN PREC IND WUHAN·Filed 2022·Granted Jul 2, 2024·0 cites·18 claims
- 1255US2025069769A1System and method for resource-efficient individual qubit addressingUNIV CALIFORNIA·Filed 2023·Application pending·0 cites
- 1354US2025078998A1System and method for mental health disorder detection system based on wearable sensors and artificial neural networksUNIV PRINCETON·Filed 2022·Application pending·0 cites
- 1448US8805054B2Method and system of classifying defects on a waferFANG WEI·Filed 2011·Granted Aug 12, 2014·0 cites·12 claims
- 1544US11900487B2Method and system of processing vehicle charging informationNEUTRON HOLDINGS INC·Filed 2021·Granted Feb 13, 2024·0 cites·15 claims
- 1644US2010158346A1Method and system of classifying defects on a waferFANG WEI·Filed 2008·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →