Inventor · disambiguated record
Yoav Berlatzky
Also filed as: BERLATZKY YOAV
15 granted patents·2 pending applications·51 citations·filing 2003–2024
90Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5NOVA MEASURING INSTR LTD4BERLATZKY YOAV2OPTUN BVI LTD2PXE COMPUTATIONAL IMAGING LTD2
Top patents by PatentIndex Score
17 records- 0194US10386311B1System and method for defect detection using multi-spot scanningAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Aug 20, 2019·10 cites·16 claims
- 0289US10161885B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2015·Granted Dec 25, 2018·5 cites·19 claims
- 0388US12467879B2Optical phase measurement method and systemNOVA LTD·Filed 2024·Granted Nov 11, 2025·0 cites·16 claims
- 0488US11029258B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jun 8, 2021·2 cites·20 claims
- 0587US9810643B1System and method for defect detection using multi-spot scanningAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Nov 7, 2017·8 cites·13 claims
- 0680US10739277B2Optical system and method for measurements of samplesNOVA MEASURING INSTR LTD·Filed 2016·Granted Aug 11, 2020·2 cites·21 claims
- 0779US11293806B2Wavefront sensor and method of using itPXE COMPUTATIONAL IMAGING LTD·Filed 2018·Granted Apr 5, 2022·3 cites·20 claims
- 0877US8614790B2Optical system and method for inspection of patterned samplesBERLATZKY YOAV·Filed 2011·Granted Dec 24, 2013·9 cites·9 claims
- 0974US2021364451A1Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2021·Application pending·0 cites
- 1072US11385188B1System and method for defect detection using multi-spot scanningAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 12, 2022·0 cites·18 claims
- 1168US9354212B2Inspection having a segmented pupilAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted May 31, 2016·1 cites·22 claims
- 1261US7218814B2Method and apparatus for optical mode conversionOPTUN BVI LTD·Filed 2003·Granted May 15, 2007·10 cites·25 claims
- 1350US12422251B2System and method for optical imaging and measurement of objectsPXE COMPUTATIONAL IMAGING LTD·Filed 2021·Granted Sep 23, 2025·0 cites·18 claims
- 1443US12456177B2System and method for digital optical aberration correction and spectral imagingPXE COMPUTATION IMAGING LTD·Filed 2021·Granted Oct 28, 2025·0 cites·16 claims
- 1539US7321705B2Method and device for optical switching and variable optical attenuationOPTUN BVI LTD·Filed 2003·Granted Jan 22, 2008·1 cites·25 claims
- 1638US9664907B2Optical element for spatial beam shapingAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted May 30, 2017·0 cites·12 claims
- 1729US2013148115A1Optical system and method for inspection of patterned samplesBERLATZKY YOAV·Filed 2011·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →