Inventor · disambiguated record
Larren G. Weber
Also filed as: WEBER LARREN G · WEBER LARREN GENE
52 granted patents·1,211 citations·filing 1992–2019
99Inventor score
Top patents by PatentIndex Score
52 records- 0197US5483175AMethod for circuits connection for wafer level burning and testing of individual dies on semiconductor waferMICRON TECHNOLOGY INC·Filed 1994·Granted Jan 9, 1996·156 cites·4 claims
- 0297US5241266ABuilt-in test circuit connection for wafer level burnin and testing of individual diesMICRON TECHNOLOGY INC·Filed 1992·Granted Aug 31, 1993·176 cites·21 claims
- 0396US9911469B1Apparatuses and methods for power efficient driver circuitsMICRON TECHNOLOGY INC·Filed 2016·Granted Mar 6, 2018·22 cites·18 claims
- 0494US5457400ASemiconductor array having built-in test circuit for wafer level testingMICRON TECHNOLOGY INC·Filed 1993·Granted Oct 10, 1995·194 cites·18 claims
- 0592US7180386B2Variable resistance circuitMICRON TECHNOLOGY INC·Filed 2005·Granted Feb 20, 2007·15 cites·23 claims
- 0688US6628139B2Digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edgesMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 30, 2003·20 cites·10 claims
- 0786US6445259B1Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 3, 2002·17 cites·24 claims
- 0886US6128244AMethod and apparatus for accessing one of a plurality of memory units within an electronic memory deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 3, 2000·78 cites·54 claims
- 0985US6724218B2Digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edgesMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 20, 2004·16 cites·6 claims
- 1084US6958661B2Variable resistance circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 25, 2005·15 cites·12 claims
- 1182US6476640B2Method for buffering an input signalMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 5, 2002·20 cites·9 claims
- 1282US5327394ATiming and control circuit for a static RAM responsive to an address transition pulseMICRON TECHNOLOGY INC·Filed 1992·Granted Jul 5, 1994·49 cites·6 claims
- 1381US6040713ABuffer with fast edge propagationMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 21, 2000·30 cites·31 claims
- 1480US6545560B1Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·16 cites·36 claims
- 1578US6239618B1Buffer with fast edge propagationMICRON TECHNOLOGY INC·Filed 2000·Granted May 29, 2001·16 cites·35 claims
- 1676US10825485B2Apparatuses and methods for power efficient driver circuitsMICRON TECHNOLOGY INC·Filed 2019·Granted Nov 3, 2020·2 cites·20 claims
- 1776US5424651AFixture for burn-in testing of semiconductor wafers, and a semiconductor waferFiled 1992·Granted Jun 13, 1995·33 cites·19 claims
- 1874US6545561B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·8 cites·24 claims
- 1974US6469591B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 22, 2002·8 cites·24 claims
- 2074US6384714B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted May 7, 2002·8 cites·46 claims
- 2174US5808896AMethod and system for creating a netlist allowing current measurement through a sub-circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 15, 1998·28 cites·22 claims
- 2273US10381050B2Apparatuses and methods for power efficient driver circuitsMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 13, 2019·2 cites·6 claims
- 2373US6919735B2Skewed nor and nand rising logic devices for rapidly propagating a rising edge of an output signalMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 19, 2005·8 cites·12 claims
- 2472US7171642B2Method and system for creating a netlist allowing current measurement through a sub-circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 30, 2007·6 cites·18 claims
- 2572US6657512B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 2, 2003·10 cites·18 claims
- 2669US6292407B1Method and apparatus for circuit variable updatesMICRON TECHNOLGY INC·Filed 1999·Granted Sep 18, 2001·26 cites·53 claims
- 2768US6556095B2Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 29, 2003·6 cites·24 claims
- 2867US6516363B1Output data path having selectable data ratesMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 4, 2003·20 cites·61 claims
- 2964US6982572B2Digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges, circuits and systems including sameMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 3, 2006·5 cites·7 claims
- 3064US6917222B2Digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges and systems including sameMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 12, 2005·5 cites·13 claims
- 3164US5815402ASystem and method for changing the connected behavior of a circuit design schematicMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 29, 1998·38 cites·41 claims
- 3262US5946218ASystem and method for changing the connected behavior of a circuit design schematicMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 31, 1999·33 cites·55 claims
- 3360US7149986B2Automated load determination for partitioned simulationMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 12, 2006·5 cites·25 claims
- 3460US7046038B2Upward and downward pulse stretcher circuits and modulesMICRON TECHNOLOGY INC·Filed 2003·Granted May 16, 2006·4 cites·4 claims
- 3560US6937066B2Digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edgesMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 30, 2005·4 cites·10 claims
- 3658US6823407B2Output data path capable of multiple data ratesMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 23, 2004·7 cites·43 claims
- 3758US6230301B1Method and system for creating a netlist allowing current measurement through a subcircuitMICRON TECHNOLOGY INC·Filed 1998·Granted May 8, 2001·9 cites·14 claims
- 3852US5901064ASystem and method for scoping global nets in a hierarchical netlistMICRON TECHNOLOGY INC·Filed 1996·Granted May 4, 1999·26 cites·20 claims
- 3950US7285986B2High speed, low power CMOS logic gateMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 23, 2007·1 cites·43 claims
- 4050US6009249AAutomated load determination for partitioned simulationMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 28, 1999·17 cites·24 claims
- 4147US6091079ASemiconductor waferMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 18, 2000·11 cites·3 claims
- 4245US6275119B1Method to find a value within a range using weighted subrangesMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 14, 2001·4 cites·25 claims
- 4344US5875115ASystem and method for scoping global nets in a flat netlistMICRON TECHNOLOGY INC·Filed 1996·Granted Feb 23, 1999·14 cites·15 claims
- 4441US6301188B1Method and apparatus for registering free flow informationMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 9, 2001·7 cites·30 claims
- 4541US6026031ARelaxed write timing for a memory deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 15, 2000·6 cites·6 claims
- 4639US6972589B2Method for rapidly propagating a fast edge of an output signal through a skewed logic deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 6, 2005·0 cites·9 claims
- 4739US6949948B2Digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edgesMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 27, 2005·0 cites·20 claims
- 4839US6891398B2Skewed falling logic device for rapidly propagating a falling edge of an output signalMICRON TECHNOLOGY INC·Filed 2003·Granted May 10, 2005·0 cites·12 claims
- 4937US6189134B1System and method for scoping global nets in a flat netlistMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 13, 2001·7 cites·18 claims
- 5035US6865628B2Output data path capable of multiple data ratesMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 8, 2005·0 cites·45 claims
Showing the top 50 of 52 patent records by PatentIndex Score.
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