Inventor · disambiguated record
Nadim F. Haddad
Also filed as: HADDAD NADIM · HADDAD NADIM F
15 granted patents·251 citations·filing 1993–2013
93Inventor score
Files withBAE SYSTEMS INFORMATION9BAE SYS INF & ELECT SYS INTEG2LORAL FEDERAL SYSTEMS COMPANY2HADDAD NADIM1IBM1
Top patents by PatentIndex Score
15 records- 0189US7876602B2Single-event upset immune static random access memory cell circuit, system, and methodBAE SYSTEMS INFORMATION·Filed 2008·Granted Jan 25, 2011·25 cites·13 claims
- 0278US6717233B1Method for fabricating resistors within semiconductor integrated circuit devicesBAE SYSTEMS INFORMATION·Filed 2000·Granted Apr 6, 2004·28 cites·14 claims
- 0378US5360752AMethod to radiation harden the buried oxide in silicon-on-insulator structuresLORAL FEDERAL SYSTEMS COMPANY·Filed 1993·Granted Nov 1, 1994·59 cites·8 claims
- 0476US5314841AMethod of forming a frontside contact to the silicon substrate of a SOI waferIBM·Filed 1993·Granted May 24, 1994·54 cites·5 claims
- 0568US6399989B1Radiation hardened silicon-on-insulator (SOI) transistor having a body contactBAE SYSTEMS INFORMATION·Filed 2000·Granted Jun 4, 2002·16 cites·6 claims
- 0666US6448862B1Single event upset immune oscillator circuitBAE SYSTEMS INFORMATION·Filed 2000·Granted Sep 10, 2002·13 cites·8 claims
- 0762US6762128B2Apparatus and method for manufacturing a semiconductor circuitBAE SYSTEMS INFORMATION·Filed 2002·Granted Jul 13, 2004·9 cites·18 claims
- 0862US5527724AMethod to prevent latch-up and improve breakdown volatge in SOI mosfetsLORAL FEDERAL SYSTEMS COMPANY·Filed 1994·Granted Jun 18, 1996·35 cites·6 claims
- 0952US6441440B1Semiconductor device and circuit having low tolerance to ionizing radiationBAE SYSTEMS INFORMATION·Filed 2000·Granted Aug 27, 2002·5 cites·10 claims
- 1051US7269057B2Method for connecting circuit elements within an integrated circuit for reducing single-event upsetsBAE SYSTEMS INFORMATION·Filed 2005·Granted Sep 11, 2007·5 cites·9 claims
- 1145US9027226B2Method for implementing prompt dose mitigating capacitorBAE SYS INF & ELECT SYS INTEG·Filed 2013·Granted May 12, 2015·0 cites·4 claims
- 1240US6716728B2Radiation hardened silicon-on-insulator (SOI) transistor having a body contactBAE SYSTEMS INFORMATION·Filed 2002·Granted Apr 6, 2004·1 cites·5 claims
- 1339US7965541B2Non-volatile single-event upset tolerant latch circuitBAE SYSTEMS INFORMATION·Filed 2008·Granted Jun 21, 2011·0 cites·11 claims
- 1438US8036023B2Single-event upset immune static random access memory cell circuitBAE SYS INF & ELECT SYS INTEG·Filed 2010·Granted Oct 11, 2011·0 cites·2 claims
- 1532US8389370B2Radiation-tolerant integrated circuit device and method for fabricatingHADDAD NADIM·Filed 2002·Granted Mar 5, 2013·1 cites·21 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →