Inventor · disambiguated record

Soomin Byun

Also filed as: BYUN SOOMIN

1 granted patent·3 citations·filing 2010–2010

20Inventor score

Technology areasH10P

Files withYANG JAEHYUN1

Top patents by PatentIndex Score

1 record

0155US8248089B2Apparatus for testing a semiconductor deviceYANG JAEHYUN·Filed 2010·Granted Aug 21, 2012·3 cites·12 claims

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