Inventor · disambiguated record
Eric P. Rudd
Also filed as: RUDD ERIC · RUDD ERIC P
29 granted patents·8 pending applications·537 citations·filing 1994–2020
97Inventor score
Top patents by PatentIndex Score
37 records- 0194US9816287B2Updating calibration of a three-dimensional measurement systemCYBEROPTICS CORP·Filed 2015·Granted Nov 14, 2017·8 cites·20 claims
- 0293US8388204B2High speed, high resolution, three dimensional solar cell inspection systemHAUGAN CARL E·Filed 2010·Granted Mar 5, 2013·16 cites·47 claims
- 0393US6577405B2Phase profilometry system with telecentric projectorCYBEROPTICS CORP·Filed 2001·Granted Jun 10, 2003·70 cites·24 claims
- 0490US11604062B2Three-dimensional sensor with counterposed channelsCYBEROPTICS CORP·Filed 2020·Granted Mar 14, 2023·2 cites·15 claims
- 0589US7813559B2Image analysis for pick and place machines with in situ component placement inspectionCYBEROPTICS CORP·Filed 2005·Granted Oct 12, 2010·24 cites·20 claims
- 0688US6678062B2Automated system with improved height sensingCYBEROPTICS CORP·Filed 2001·Granted Jan 13, 2004·52 cites·32 claims
- 0787US5897611AHigh precision semiconductor component alignment systemsCYBEROPTICS CORP·Filed 1996·Granted Apr 27, 1999·72 cites·53 claims
- 0884US6750899B1Solder paste inspection systemCYBEROPTICS CORP·Filed 2000·Granted Jun 15, 2004·38 cites·20 claims
- 0984US6583884B2Tomographic reconstruction of electronic components from shadow image sensor dataCYBEROPTICS CORP·Filed 2002·Granted Jun 24, 2003·31 cites·23 claims
- 1081US6744499B2Calibration methods for placement machines incorporating on-head linescan sensingCYBEROPTICS CORP·Filed 2003·Granted Jun 1, 2004·23 cites·13 claims
- 1179US10346963B2Point cloud merging from multiple cameras and sources in three-dimensional profilometryCYBEROPTICS CORP·Filed 2015·Granted Jul 9, 2019·3 cites·26 claims
- 1278US8068664B2Component sensor for pick and place machine using improved shadow imagingRUDD ERIC P·Filed 2008·Granted Nov 29, 2011·11 cites·13 claims
- 1376US10883823B2Three-dimensional sensor with counterposed channelsCYBEROPTICS CORP·Filed 2019·Granted Jan 5, 2021·1 cites·20 claims
- 1475US5519204AMethod and apparatus for exposure control in light-based measurement instrumentsCYBEROPTICS CORP·Filed 1994·Granted May 21, 1996·30 cites·12 claims
- 1574US6049384AMethod and apparatus for three dimensional imaging using multi-phased structured lightCYBEROPTICS CORP·Filed 1997·Granted Apr 11, 2000·38 cites·33 claims
- 1670US6535291B1Calibration methods for placement machines incorporating on-head linescan sensingCYBEROPTICS CORP·Filed 2000·Granted Mar 18, 2003·13 cites·13 claims
- 1768US11029146B2Three-dimensional sensor with counterposed channelsCYBEROPTICS COPORATION·Filed 2019·Granted Jun 8, 2021·1 cites·33 claims
- 1867US6288786B1Digital range sensor systemCYBEROPTICS CORP·Filed 2000·Granted Sep 11, 2001·19 cites·21 claims
- 1963US7190393B2Camera with improved illuminatorCYBEROPTICS CORP·Filed 2004·Granted Mar 13, 2007·5 cites·18 claims
- 2062US6385335B1Apparatus and method for estimating background tilt and offsetCYBEROPTICS CORP·Filed 2000·Granted May 7, 2002·8 cites·16 claims
- 2159US11421983B2Structured light projection for specular surfacesCYBEROPTICS CORP·Filed 2019·Granted Aug 23, 2022·0 cites·22 claims
- 2259US6490048B1Tomographic reconstruction of electronic components from shadow image sensor dataCYBEROPTICS CORP·Filed 1999·Granted Dec 3, 2002·24 cites·14 claims
- 2358US11073380B2Structured light projection for specular surfacesCYBEROPTICS CORP·Filed 2019·Granted Jul 27, 2021·0 cites·17 claims
- 2456US2009135251A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCYBEROPTICS CORP·Filed 2009·Application pending·0 cites
- 2556US2009133249A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCYBEROPTICS CORP·Filed 2009·Application pending·0 cites
- 2652US6593705B1Rapid-firing flashlamp discharge circuitCYBEROPTICS CORP·Filed 2001·Granted Jul 15, 2003·5 cites·14 claims
- 2750US2007003126A1Method and apparatus for evaluating a component pick action in an electronics assembly machineCASE STEVEN K·Filed 2006·Application pending·0 cites
- 2845US6353478B1Digital range sensor systemCYBEROPTICS CORP·Filed 1999·Granted Mar 5, 2002·16 cites·72 claims
- 2945US5665958AMethod and apparatus for exposure control in light-based measurement instrumentsCYBEROPTICS CORP·Filed 1996·Granted Sep 9, 1997·8 cites·2 claims
- 3045US2007130755A1Electronics assembly machine with embedded solder paste inspectionDUQUETTE DAVID W·Filed 2006·Application pending·0 cites
- 3144US2014198185A1Multi-camera sensor for three-dimensional imaging of a circuit boardCYBEROPTICS CORP·Filed 2014·Application pending·0 cites
- 3244US2012133920A1High speed, high resolution, three dimensional printed circuit board inspection systemSKUNES TIMOTHY A·Filed 2011·Application pending·0 cites
- 3342US5821527AMethod and apparatus for exposure control in light-based measurement instrumentsCYBEROPTICS CORP·Filed 1997·Granted Oct 13, 1998·6 cites·4 claims
- 3438US2002080236A1Camera with improved illuminatorFiled 2001·Application pending·0 cites
- 3536US6088110ADigital range sensor systemCYBEROPTICS CORP·Filed 1999·Granted Jul 11, 2000·9 cites·26 claims
- 3636US2017264885A1Field calibration of three-dimensional non-contact scanning systemCYBEROPTICS CORP·Filed 2017·Application pending·0 cites
- 3734US6115491AApparatus and method for estimating background tilt and offsetCYBEROPTICS CORP·Filed 1998·Granted Sep 5, 2000·4 cites·33 claims
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