Inventor · disambiguated record
Brian J. Wojszynski
Also filed as: WOJSZYNSKI BRIAN J
4 granted patents·43 citations·filing 1997–2003
72Inventor score
Technology areasG01R
Files withIBM4
Top patents by PatentIndex Score
4 records- 0166US5917329ASubstrate tester having shorting pad actuator method and apparatusIBM·Filed 1997·Granted Jun 29, 1999·30 cites·16 claims
- 0240US6753688B2Interconnect package cluster probe short removal apparatus and methodIBM·Filed 2001·Granted Jun 22, 2004·3 cites·21 claims
- 0339US6005386ASubstrate tester method and apparatus having rotatable and infinitely adjustable locator jawsIBM·Filed 1997·Granted Dec 21, 1999·10 cites·13 claims
- 0433US7808257B2Ionization test for electrical verificationIBM·Filed 2003·Granted Oct 5, 2010·0 cites·63 claims
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