Inventor · disambiguated record
Shigeru Kawamata
Also filed as: KAWAMATA SHIGERU
19 granted patents·1 pending application·72 citations·filing 1978–2019
91Inventor score
Files withHITACHI HIGH TECH CORP12HITACHI LTD2HOSHINO YOSHINOBU2HIRATO TATSUYA1HITACHI NAKA SEIKI KK1
Top patents by PatentIndex Score
20 records- 0189US7705304B2Scanning electron microscope and three-dimensional shape measuring device that used itHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 27, 2010·13 cites·8 claims
- 0277US10522325B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Dec 31, 2019·2 cites·17 claims
- 0376US9202669B2Charged particle beam device and image display method for stereoscopic observation and stereoscopic displayHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 1, 2015·4 cites·5 claims
- 0474US5523567AScanning electron microscope and image forming method therewithHITACHI LTD·Filed 1994·Granted Jun 4, 1996·27 cites·8 claims
- 0566US11404242B2Charged particle beam device and method for setting condition in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 2, 2022·1 cites·12 claims
- 0665US11321585B2Imaging device and morphological feature data display methodHITACHI HIGH TECH CORP·Filed 2017·Granted May 3, 2022·2 cites·18 claims
- 0763US10763078B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 1, 2020·0 cites·17 claims
- 0863US8143573B2Charged particle beam apparatusITO SUKEHIRO·Filed 2009·Granted Mar 27, 2012·1 cites·20 claims
- 0962US10763074B2Charged particle beam apparatus, observation method using charged particle beam apparatus, and programHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 1, 2020·0 cites·3 claims
- 1062US8848049B2Charged particle beam device and method for correcting detected signal thereofKAMIO Masato·Filed 2011·Granted Sep 30, 2014·2 cites·16 claims
- 1160US9012842B2Charged particle beam device and inclined observation image display methodHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 21, 2015·1 cites·5 claims
- 1254US5142147AImage processing device for an electron microscopeHITACHI NAKA SEIKI KK·Filed 1990·Granted Aug 25, 1992·16 cites·4 claims
- 1352US10453650B2Charged particle beam apparatus, observation method using charged particle beam apparatus, and programHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 22, 2019·0 cites·18 claims
- 1445US11385193B2Imaging deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 12, 2022·0 cites·12 claims
- 1542US2012132803A1Charged particle beam device and image display methodHIRATO TATSUYA·Filed 2010·Application pending·0 cites
- 1641US11239050B2Imaging deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Feb 1, 2022·0 cites·17 claims
- 1738US9099283B2Charged particle beam apparatusHOSHINO YOSHINOBU·Filed 2010·Granted Aug 4, 2015·0 cites·8 claims
- 1837US12215308B2Charged particle beam apparatus and cell evaluation methodHITACHI HIGH TECH CORP·Filed 2017·Granted Feb 4, 2025·0 cites·5 claims
- 1937US8947520B2Electron microscopeHOSHINO YOSHINOBU·Filed 2010·Granted Feb 3, 2015·0 cites·9 claims
- 2036US4257060ASemiconductor switchHITACHI LTD·Filed 1978·Granted Mar 17, 1981·3 cites·12 claims
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