Inventor · disambiguated record
Szu Huat Goh
Also filed as: GOH SZU HUAT · GOH SZU HUAT (WU SHIFA)
8 granted patents·2 pending applications·8 citations·filing 2015–2022
77Inventor score
Files withGLOBALFOUNDRIES SG PTE LTD10
Top patents by PatentIndex Score
10 records- 0184US9739831B2Defect isolation methods and systemsGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Aug 22, 2017·4 cites·20 claims
- 0282US9958502B2Defect isolation methods and systemsGLOBALFOUNDRIES SG PTE LTD·Filed 2016·Granted May 1, 2018·3 cites·20 claims
- 0377US10336608B2Methods for fabricating electronic devices including substantially hermetically sealed cavities and getter filmsGLOBALFOUNDRIES SG PTE LTD·Filed 2017·Granted Jul 2, 2019·1 cites·20 claims
- 0465US11639959B2Defect localization in embedded memoryGLOBALFOUNDRIES SG PTE LTD·Filed 2021·Granted May 2, 2023·0 cites·20 claims
- 0556US9718672B2Electronic devices including substantially hermetically sealed cavities and getter films with Kelvin measurement arrangement for evaluating the getter films and methods for fabricating the sameGLOBALFOUNDRIES SG PTE LTD·Filed 2015·Granted Aug 1, 2017·0 cites·18 claims
- 0651US2023335580A1Electronic device with galvanic isolation and integration methodsGLOBALFOUNDRIES SG PTE LTD·Filed 2022·Application pending·0 cites
- 0747US10817644B2Circuit and method for design of RF integrated circuits for process control monitoringGLOBALFOUNDRIES SG PTE LTD·Filed 2018·Granted Oct 27, 2020·0 cites·17 claims
- 0841US11631470B2Semiconductor chip, method of fabricating thereof, and method of testing a plurality of semiconductor chipsGLOBALFOUNDRIES SG PTE LTD·Filed 2021·Granted Apr 18, 2023·0 cites·20 claims
- 0941US10962592B2Defect localization in embedded memoryGLOBALFOUNDRIES SG PTE LTD·Filed 2018·Granted Mar 30, 2021·0 cites·18 claims
- 1038US2020065183A1Method for determining and optimizing timing specifications for an integrated circuitGLOBALFOUNDRIES SG PTE LTD·Filed 2018·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →