Inventor · disambiguated record
Yen-Lung Li
Also filed as: LI YEN-LUNG · LI YEN-LUNG JASON
9 granted patents·2 pending applications·46 citations·filing 2015–2023
85Inventor score
Top patents by PatentIndex Score
11 records- 0193US10153051B1Program-verify of select gate transistor with doped channel in NAND stringSANDISK TECHNOLOGIES LLC·Filed 2018·Granted Dec 11, 2018·16 cites·20 claims
- 0289US9922719B2Multi-VT sensing method by varying bit line voltageSANDISK TECHNOLOGIES INC·Filed 2015·Granted Mar 20, 2018·11 cites·18 claims
- 0384US10115440B2Word line contact regions for three-dimensional non-volatile memorySANDISK TECHNOLOGIES LLC·Filed 2017·Granted Oct 30, 2018·7 cites·16 claims
- 0476US9595317B2Multi-state programming for non-volatile memorySANDISK TECHNOLOGIES INC·Filed 2015·Granted Mar 14, 2017·4 cites·21 claims
- 0573US9881676B1Sense amplifier with program biasing and fast sensingSANDISK TECHNOLOGIES LLC·Filed 2016·Granted Jan 30, 2018·3 cites·20 claims
- 0668US10475493B2Word-line pre-charging in power-on read operation to reduce programming voltage leakageSANDISK TECHNOLOGIES LLC·Filed 2017·Granted Nov 12, 2019·2 cites·21 claims
- 0766US9892791B2Fast scan to detect bit line discharge timeSANDISK TECHNOLOGIES INC·Filed 2016·Granted Feb 13, 2018·2 cites·21 claims
- 0859US10726940B2Column skip inconsistency correctionSANDISK TECHNOLOGIES LLC·Filed 2019·Granted Jul 28, 2020·1 cites·20 claims
- 0946US2025006277A1Analog bitscan techniques in a memory deviceWESTERN DIGITAL TECH INC·Filed 2023·Application pending·0 cites
- 1043US10908838B2Column replacement with non-dedicated replacement columnsSANDISK TECHNOLOGIES LLC·Filed 2019·Granted Feb 2, 2021·0 cites·18 claims
- 1136US2021383879A1Coupling capacitance reduction during program verify for performance improvementSANDISK TECHNOLOGIES LLC·Filed 2020·Application pending·0 cites
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