Inventor · disambiguated record
Makoto Kawano
Also filed as: KAWANO MAKOTO · KOUNO MAKOTO
29 granted patents·3 pending applications·238 citations·filing 1994–2022
95Inventor score
Files withKAWANO LAB INC6RENESAS TECH CORP4TOSHIBA MACHINE CO LTD3YOKOGAWA ELECTRIC CORP3CALSONIC KANSEI CORP2
Top patents by PatentIndex Score
32 records- 0192US5713253ARotational machining methodTOSHIBA MACHINE CO LTD·Filed 1995·Granted Feb 3, 1998·95 cites·15 claims
- 0283US11391663B2Particle analyzing apparatus, particle separating device, particle analysis method, and particle separating methodKAWANO LAB INC·Filed 2017·Granted Jul 19, 2022·2 cites·8 claims
- 0381US10739240B2Particle analyzerKAWANO LAB INC·Filed 2016·Granted Aug 11, 2020·2 cites·24 claims
- 0477US10767544B2Valve body, electronic control throttle body, motor-driven throttle body, and valve deviceHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2017·Granted Sep 8, 2020·2 cites·14 claims
- 0575US9548506B2Fuel cell evaluator and fuel cell evaluation methodYAMAZAKI DAISUKE·Filed 2011·Granted Jan 17, 2017·4 cites·12 claims
- 0674US10656119B2Dispersoid particle analyzing method and analyzing apparatusKAWANO LAB INC·Filed 2016·Granted May 19, 2020·1 cites·10 claims
- 0774US9194900B2Electrode evaluation apparatus and electrode evaluation methodYOKOGAWA ELECTRIC CORP·Filed 2013·Granted Nov 24, 2015·2 cites·19 claims
- 0870US9366614B2Porosity measuring device and porosity measuring methodKAWANO MAKOTO·Filed 2012·Granted Jun 14, 2016·3 cites·7 claims
- 0965US7385278B2Strobe light control circuit and IGBT deviceRENESAS TECH CORP·Filed 2006·Granted Jun 10, 2008·2 cites·17 claims
- 1065US5482589AMethod and apparatus for making pre-cut pre-preg tapeTOSHIBA MACHINE CO LTD·Filed 1994·Granted Jan 9, 1996·24 cites·4 claims
- 1164US7230324B2Strobe light control circuit and IGBT deviceRENESAS TECH CORP·Filed 2005·Granted Jun 12, 2007·2 cites·5 claims
- 1263US5347760AGear finishing apparatusHONDA MOTOR CO LTD·Filed 1994·Granted Sep 20, 1994·26 cites·14 claims
- 1362US12173666B2Throttle valve control deviceHITACHI ASTEMO LTD·Filed 2022·Granted Dec 24, 2024·0 cites·5 claims
- 1462US2023137328A1Methane generating deviceYOKOGAWA ELECTRIC CORP·Filed 2021·Application pending·0 cites
- 1561US10261050B2Method for measuring characteristics of a particle and device for measuring characteristics of a particleUNIV OSAKA·Filed 2014·Granted Apr 16, 2019·1 cites·14 claims
- 1661US9535131B2Method for determining response characteristics of batteryYOKOGAWA ELECTRIC CORP·Filed 2013·Granted Jan 3, 2017·1 cites·14 claims
- 1760US9018073B2Method of manufacturing a semiconductor device including alignment markFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Apr 28, 2015·1 cites·8 claims
- 1859US5751584AMethod for checking interference, method for checking processing program, and method for checking processing proprietyTOSHIBA MACHINE CO LTD·Filed 1995·Granted May 12, 1998·28 cites·10 claims
- 1956USD642550SCommunication terminalFUNAI ELECTRIC CO·Filed 2010·Granted Aug 2, 2011·9 cites·1 claims
- 2056US6412174B1Method of manufacturing heat exchange tubeCALSONIC KANSEI CORP·Filed 1999·Granted Jul 2, 2002·18 cites·17 claims
- 2152US11105771B2Magnetic field generation device, measurement cell, analysis apparatus, and particle separation deviceKAWANO LAB INC·Filed 2017·Granted Aug 31, 2021·0 cites·14 claims
- 2250US11282922B2Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Mar 22, 2022·0 cites·6 claims
- 2350US10752575B24-alkoxy-3-(trifluoromethyl)benzyl alcohol production methodMITSUBISHI TANABE PHARMA CORP·Filed 2017·Granted Aug 25, 2020·0 cites·17 claims
- 2449US6325276B1Method and apparatus for applying flux for use in brazing aluminum materialCALSONIC KANSEI CORP·Filed 1999·Granted Dec 4, 2001·13 cites·4 claims
- 2545US10809228B2Method and apparatus for quantitatively evaluating amount of dispersion medium adsorbed to dispersoid particlesKAWANO LAB INC·Filed 2016·Granted Oct 20, 2020·0 cites·16 claims
- 2645US6879024B2Strobe light control circuit and IGBT deviceRENESAS TECH CORP·Filed 2003·Granted Apr 12, 2005·1 cites·5 claims
- 2743US11988636B2Method for particle analysis and method for particle productionKAWANO LAB INC·Filed 2020·Granted May 21, 2024·0 cites·6 claims
- 2838US10429287B2Interferometric method for measuring a size of particle in the presence of a gapUNIV OSAKA·Filed 2015·Granted Oct 1, 2019·0 cites·20 claims
- 2938US9128166B2Secondary battery tester, secondary battery testing method, and manufacturing method of secondary batteryAKUTSU TOMOMI·Filed 2011·Granted Sep 8, 2015·0 cites·15 claims
- 3032US2017062412A1Transistor element and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2016·Application pending·0 cites
- 3130US6391997B1Method for producing diene-based rubber polymer latexMITSUBISHI RAYON CO·Filed 1999·Granted May 21, 2002·1 cites·5 claims
- 3229US2010259201A1Semiconductor deviceRENESAS TECH CORP·Filed 2010·Application pending·0 cites
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