Inventor · disambiguated record
Kenneth W. Deboe
Also filed as: DEBOE KENNETH W
33 granted patents·4 pending applications·168 citations·filing 2006–2024
97Inventor score
Top patents by PatentIndex Score
37 records- 0198US11255903B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2020·Granted Feb 22, 2022·12 cites·11 claims
- 0297US12007451B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Jun 11, 2024·2 cites·15 claims
- 0397US9316683B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2015·Granted Apr 19, 2016·19 cites·10 claims
- 0497US8506335B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Aug 13, 2013·31 cites·6 claims
- 0596US12292484B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted May 6, 2025·1 cites·20 claims
- 0696US8628336B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Jan 14, 2014·26 cites·11 claims
- 0796US7762822B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2006·Granted Jul 27, 2010·29 cites·37 claims
- 0894US8388357B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2012·Granted Mar 5, 2013·12 cites·58 claims
- 0994US8118618B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2010·Granted Feb 21, 2012·13 cites·59 claims
- 1094US7667475B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2008·Granted Feb 23, 2010·16 cites·87 claims
- 1191US2025093398A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1291US2025093399A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1390US12265136B2Method and system for thermal control of devices in electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Apr 1, 2025·0 cites·9 claims
- 1489US12163999B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2023·Granted Dec 10, 2024·0 cites·22 claims
- 1588US12169217B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Dec 17, 2024·0 cites·10 claims
- 1688US2024302451A1Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 1785US11821940B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Nov 21, 2023·0 cites·9 claims
- 1883US9151797B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 1982US8747123B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2013·Granted Jun 10, 2014·2 cites·5 claims
- 2081US11860221B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2022·Granted Jan 2, 2024·0 cites·12 claims
- 2180US11635459B2Electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Apr 25, 2023·0 cites·9 claims
- 2280US10649022B2Electronics testerAEHR TEST SYSTEMS·Filed 2018·Granted May 12, 2020·1 cites·13 claims
- 2379US9291668B2Electronics tester with a valve integrally formed in a component of a portable packAEHR TEST SYSTEMS·Filed 2015·Granted Mar 22, 2016·1 cites·29 claims
- 2476US10466292B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2017·Granted Nov 5, 2019·1 cites·19 claims
- 2575US10976362B2Electronics tester with power saving stateAEHR TEST SYSTEMS·Filed 2020·Granted Apr 13, 2021·0 cites·11 claims
- 2674US11199572B2Electronics testerAEHR TEST SYSTEMS·Filed 2020·Granted Dec 14, 2021·0 cites·14 claims
- 2772US10718808B2Electronics tester with current amplificationAEHR TEST SYSTEMS·Filed 2018·Granted Jul 21, 2020·0 cites·9 claims
- 2869US10852347B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2018·Granted Dec 1, 2020·0 cites·14 claims
- 2969US10151793B2Electronics tester with double-spiral thermal control passage in a thermal chuckAEHR TEST SYSTEMS·Filed 2017·Granted Dec 11, 2018·0 cites·76 claims
- 3067US11209497B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2019·Granted Dec 28, 2021·0 cites·29 claims
- 3167US9857418B2Electronics tester with group and individual current configurationsAEHR TEST SYSTEMS·Filed 2016·Granted Jan 2, 2018·0 cites·9 claims
- 3265US9500702B2Electronics tester with hot fluid thermal controlAEHR TEST SYSTEMS·Filed 2016·Granted Nov 22, 2016·0 cites·13 claims
- 3364US10094872B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2016·Granted Oct 9, 2018·0 cites·16 claims
- 3464US2025093400A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 3555US9086449B2Adhesively attached stand-offs on a portable pack for an electronics testerSTEPS STEVEN C·Filed 2012·Granted Jul 21, 2015·0 cites·87 claims
- 3655US7902846B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2010·Granted Mar 8, 2011·0 cites·93 claims
- 3753US8198909B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionSTEPS STEVEN C·Filed 2011·Granted Jun 12, 2012·0 cites·9 claims
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