Inventor · disambiguated record
Eric Barr Kushnick
Also filed as: KUSHNICK ERIC · KUSHNICK ERIC B · KUSHNICK ERIC BARR
18 granted patents·2 pending applications·152 citations·filing 1996–2014
93Inventor score
Top patents by PatentIndex Score
20 records- 0192US10162007B2Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independentlyADVANTEST CORP·Filed 2013·Granted Dec 25, 2018·13 cites·32 claims
- 0286US9310427B2High speed tester communication interface between test slice and traysADVANTEST CORP·Filed 2013·Granted Apr 12, 2016·6 cites·20 claims
- 0384US10161962B2Universal test cellADVANTEST CORP·Filed 2014·Granted Dec 25, 2018·4 cites·20 claims
- 0481US7463018B2Carrier module for adapting non-standard instrument cards to test systemsADVANTEST CORP·Filed 2008·Granted Dec 9, 2008·10 cites·17 claims
- 0579US7996168B2Method and apparatus for time vernier calibrationADVANTEST CORP·Filed 2009·Granted Aug 9, 2011·8 cites·22 claims
- 0677US7362089B2Carrier module for adapting non-standard instrument cards to test systemsADVANTEST CORP·Filed 2004·Granted Apr 22, 2008·19 cites·27 claims
- 0777US5694377ADifferential time interpolatorLTX CORP·Filed 1996·Granted Dec 2, 1997·61 cites·30 claims
- 0876US7620858B2Fabric-based high speed serial crossbar switch for ATEADVANTEST CORP·Filed 2006·Granted Nov 17, 2009·5 cites·32 claims
- 0972US9995767B2Universal container for device under testADVANTEST CORP·Filed 2014·Granted Jun 12, 2018·4 cites·20 claims
- 1067US10652131B2Method and apparatus to provide both high speed and low speed signaling from the high speed transceivers on an field programmable gate arrayADVANTEST CORP·Filed 2014·Granted May 12, 2020·2 cites·21 claims
- 1160US7684280B2Histogram generation with banks for improved memory access performanceADVANTEST CORP·Filed 2007·Granted Mar 23, 2010·4 cites·8 claims
- 1258US7672805B2Synchronization of modules for analog and mixed signal testing in an open architecture test systemADVANTEST CORP·Filed 2004·Granted Mar 2, 2010·7 cites·22 claims
- 1357US9933454B2Universal test floor systemADVANTEST CORP·Filed 2014·Granted Apr 3, 2018·0 cites·20 claims
- 1453US7805628B2High resolution clock signal generatorCREDENCE SYSTEMS CORP·Filed 2001·Granted Sep 28, 2010·5 cites·36 claims
- 1549US7606849B2Method and apparatus for improving the frequency resolution of a direct digital synthesizerADVANTEST CORP·Filed 2004·Granted Oct 20, 2009·4 cites·9 claims
- 1642US8327090B2Histogram generation with mixed binning memoryJONES MICHAEL FRANK·Filed 2007·Granted Dec 4, 2012·0 cites·18 claims
- 1739US8312327B2Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording mediumHOU HARRY·Filed 2009·Granted Nov 13, 2012·0 cites·20 claims
- 1838US2014070831A1System and method of protecting probes by using an intelligent current sensing switchADVANTEST CORP·Filed 2013·Application pending·0 cites
- 1937US8504867B2High resolution clock signal generatorKUSHNICK ERIC B·Filed 2010·Granted Aug 6, 2013·0 cites·20 claims
- 2037US2010278226A1Transmission circuit, differential signal transmission circuit, and test apparatusADVANTEST CORP·Filed 2010·Application pending·0 cites
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