Inventor · disambiguated record
William D. Heavlin
Also filed as: HEAVLIN WILLIAM D · Heavlin William Dow
13 granted patents·1 pending application·901 citations·filing 1995–2019
94Inventor score
Top patents by PatentIndex Score
14 records- 0197US5655110AMethod for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafersADVANCED MICRO DEVICES INC·Filed 1995·Granted Aug 5, 1997·284 cites·39 claims
- 0295US5646870AMethod for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-produced semiconductor wafersADVANCED MICRO DEVICES INC·Filed 1995·Granted Jul 8, 1997·164 cites·41 claims
- 0391US10101050B2Dispatch engine for optimizing demand-response thermostat eventsGOOGLE LLC·Filed 2016·Granted Oct 16, 2018·11 cites·20 claims
- 0491US6567717B2Feed-forward control of TCI doping for improving mass-production-wise, statistical distribution of critical performance parameters in semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2000·Granted May 20, 2003·59 cites·19 claims
- 0590US5946214AComputer implemented method for estimating fabrication yield for semiconductor integrated circuit including memory blocks with redundant rows and/or columnsADVANCED MICRO DEVICES INC·Filed 1997·Granted Aug 31, 1999·130 cites·23 claims
- 0679US5966527AApparatus, article of manufacture, method and system for simulating a mass-produced semiconductor device behaviorADVANCED MICRO DEVICES INC·Filed 1996·Granted Oct 12, 1999·91 cites·37 claims
- 0778US6708073B1Lot specific process design methodologyADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 16, 2004·23 cites·32 claims
- 0877US6586755B1Feed-forward control of TCI doping for improving mass-production-wise statistical distribution of critical performance parameters in semiconductor devicesADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 1, 2003·20 cites·22 claims
- 0967US5724251ASystem and method for designing, fabricating and testing multiple cell test structures to validate a cell libraryADVANCED MICRO DEVICES INC·Filed 1995·Granted Mar 3, 1998·29 cites·21 claims
- 1063US6304836B1Worst case design parameter extraction for logic technologiesADVANCED MICRO DEVICES INC·Filed 1998·Granted Oct 16, 2001·43 cites·33 claims
- 1155US6366822B1Statistical process window design methodologyADVANCED MICRO DEVICES INC·Filed 1998·Granted Apr 2, 2002·22 cites·32 claims
- 1246US6389366B1Methods for identifying sources of patterns in processing effects in manufacturingADVANCED MICRO DEVICES INC·Filed 1999·Granted May 14, 2002·25 cites·16 claims
- 1341US7069196B1Experimental design for complex systemsADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 27, 2006·0 cites·14 claims
- 1437US2021273858A1Machine-Learned Prediction of Network Resources and MarginsGOOGLE LLC·Filed 2019·Application pending·0 cites
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