Inventor · disambiguated record
Jongik Won
Also filed as: WON JONGIK
8 granted patents·2 pending applications·32 citations·filing 2001–2024
81Inventor score
Files withLIGHTWAVE MICROSYSTEMS CORP3SAMSUNG ELECTRONICS CO LTD3LIGHTWAVE MICROSYSTEMS INC2NEOPHOTONICS CORP2
Top patents by PatentIndex Score
10 records- 0166US6732550B2Method for performing a deep trench etch for a planar lightwave circuitLIGHTWAVE MICROSYSTEMS INC·Filed 2001·Granted May 11, 2004·13 cites·9 claims
- 0266US6542687B2Reducing polarization dependent loss caused by polarization dependent wavelength shift using core over-etch for planar lightwave circuit fabricationLIGHTWAVE MICROSYSTEMS INC·Filed 2001·Granted Apr 1, 2003·10 cites·18 claims
- 0364US6690025B2Devices for etch loading planar lightwave circuitsLIGHTWAVE MICROSYSTEMS CORP·Filed 2001·Granted Feb 10, 2004·8 cites·23 claims
- 0451US12498765B2Method for displaying preview image and electronic device supporting the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 16, 2025·0 cites·19 claims
- 0550US2025016967A1Electronic device comprising conductive connectorSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0649US9052460B2Integrated circuit coupling system with waveguide circuitry and method of manufacture thereofNEOPHOTONICS CORP·Filed 2012·Granted Jun 9, 2015·0 cites·10 claims
- 0748US9329346B2Integrated circuit coupling system with waveguide circuitry and method of manufacture thereofNEOPHOTONICS CORP·Filed 2015·Granted May 3, 2016·0 cites·8 claims
- 0846US7182878B2Methods for etch loading planar lightwave circuitsLIGHTWAVE MICROSYSTEMS CORP·Filed 2004·Granted Feb 27, 2007·1 cites·7 claims
- 0941US11482871B2Electronic device and charging control method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Oct 25, 2022·0 cites·12 claims
- 1039US2003133684A1Reducing polarization dependent loss caused by polarization dependent wavelength shift using core over-etch for planar lightwave circuit fabricationLIGHTWAVE MICROSYSTEMS CORP·Filed 2003·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →