Inventor · disambiguated record
Junji Endo
Also filed as: ENDO JUNJI
17 granted patents·2 pending applications·306 citations·filing 1984–2012
95Inventor score
Files withTOYODA CHUO KENKYUSHO KK7HITACHI LTD6JAPAN RES DEV CORP2TANAKA HISANORI2JAPAN SCIENCE & TECH AGENCY1
Top patents by PatentIndex Score
19 records- 0189US4935625AElectron holography apparatusHITACHI LTD·Filed 1988·Granted Jun 19, 1990·46 cites·9 claims
- 0279US4844949AMethod of surface treatment and apparatus used thereforTOYODA CHUO KENKYUSHO KK·Filed 1988·Granted Jul 4, 1989·39 cites·15 claims
- 0378US6838675B2Specimen observation system for applying external magnetic fieldHITACHI LTD·Filed 2002·Granted Jan 4, 2005·14 cites·25 claims
- 0477US5192867AElectron optical measurement apparatusHITACHI LTD·Filed 1991·Granted Mar 9, 1993·33 cites·5 claims
- 0569US4945247AField emission electron gun systemHITACHI LTD·Filed 1989·Granted Jul 31, 1990·15 cites·6 claims
- 0667US6950195B2Interference measuring deviceJAPAN SCIENCE & TECH AGENCY·Filed 2001·Granted Sep 27, 2005·7 cites·21 claims
- 0765US5059859ACharged particle beam generating apparatus of multi-stage acceleration typeHITACHI LTD·Filed 1990·Granted Oct 22, 1991·19 cites·33 claims
- 0865US4765847AMethod of treating the surface of iron alloy materialsTOYODA CHUO KENKYUSHO KK·Filed 1986·Granted Aug 23, 1988·23 cites·20 claims
- 0964US4686117AMethod of forming a carbide layerTOYODA CHUO KENKYUSHO KK·Filed 1986·Granted Aug 11, 1987·22 cites·26 claims
- 1063US5811805ACharged particle guide apparatus and image viewing apparatus for charged particle microscope using the sameJAPAN RES DEV CORP·Filed 1996·Granted Sep 22, 1998·18 cites·20 claims
- 1161US4642461AField emission type electron microscope using a multi-stage acceleration tubeHITACHI LTD·Filed 1984·Granted Feb 10, 1987·10 cites·6 claims
- 1257US9130572B2Controller provided with touch detection device including movable and fixed contact patternsTANAKA HISANORI·Filed 2012·Granted Sep 8, 2015·3 cites·17 claims
- 1356US4786526ASurface treating method and apparatusTOYODA CHUO KENKYUSHO KK·Filed 1986·Granted Nov 22, 1988·17 cites·10 claims
- 1453US4514275AApparatus for physical vapor depositionTOYODA CHUO KENKYUSHO KK·Filed 1984·Granted Apr 30, 1985·14 cites·13 claims
- 1552US4569862AMethod of forming a nitride layerTOYODA CHUO KENKYUSHO KK·Filed 1985·Granted Feb 11, 1986·14 cites·22 claims
- 1643US4871401AFluidized bed method of forming a nitride or carbonitride layerTOYODA CHUO KENKYUSHO KK·Filed 1987·Granted Oct 3, 1989·9 cites·19 claims
- 1735US2013082951A1Touch sensor, and controller provided with the touch sensorTANAKA HISANORI·Filed 2012·Application pending·0 cites
- 1834US2005146730A1Coherent beam device for observing and measuring sampleFiled 2002·Application pending·0 cites
- 1928US5446589AInterference device and method for observing phase informalitiesJAPAN RES DEV CORP·Filed 1993·Granted Aug 29, 1995·3 cites·4 claims
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