Inventor · disambiguated record
Edward B. Eichelberger
Also filed as: EICHELBERGER EDWARD B · EICHELBERGER EDWARD BAXTER
18 granted patents·651 citations·filing 1974–1994
95Inventor score
Files withIBM18
Top patents by PatentIndex Score
18 records- 0196US4801870AWeighted random pattern testing apparatus and methodIBM·Filed 1988·Granted Jan 31, 1989·154 cites·4 claims
- 0295US4063080AMethod of propagation delay testing a level sensitive array logic systemIBM·Filed 1976·Granted Dec 13, 1977·48 cites·25 claims
- 0395US3961252ATesting embedded arraysIBM·Filed 1974·Granted Jun 1, 1976·69 cites·11 claims
- 0494US4687988AWeighted random pattern testing apparatus and methodIBM·Filed 1985·Granted Aug 18, 1987·133 cites·3 claims
- 0590US4051352ALevel sensitive embedded array logic systemIBM·Filed 1976·Granted Sep 27, 1977·41 cites·16 claims
- 0689US4074851AMethod of level sensitive testing a functional logic system with embedded arrayIBM·Filed 1976·Granted Feb 21, 1978·35 cites·26 claims
- 0787US4745355AWeighted random pattern testing apparatus and methodIBM·Filed 1987·Granted May 17, 1988·58 cites·6 claims
- 0879US4006492AHigh density semiconductor chip organizationIBM·Filed 1975·Granted Feb 1, 1977·23 cites·25 claims
- 0975US4071902AReduced overhead for clock testing in a level system scan design (LSSD) systemIBM·Filed 1976·Granted Jan 31, 1978·23 cites·14 claims
- 1073US4063078AClock generation network for level sensitive logic systemIBM·Filed 1976·Granted Dec 13, 1977·18 cites·21 claims
- 1149US4760289ATwo-level differential cascode current switch mastersliceIBM·Filed 1986·Granted Jul 26, 1988·18 cites·3 claims
- 1249US4546473ARandom pattern self test designIBM·Filed 1983·Granted Oct 8, 1985·8 cites·7 claims
- 1344US3986057AHigh performance latch circuitIBM·Filed 1975·Granted Oct 12, 1976·4 cites·13 claims
- 1442US5389832ACapacitively cross-coupled DCS emitter-follower output stageIBM·Filed 1994·Granted Feb 14, 1995·7 cites·5 claims
- 1541US5852367ASpeed enhanced level shifting circuit utilizing diode capacitanceIBM·Filed 1992·Granted Dec 22, 1998·6 cites·26 claims
- 1632US5396182ALow signal margin detect circuitIBM·Filed 1992·Granted Mar 7, 1995·4 cites·2 claims
- 1729US5274285AEnhanced differential current switch compensating upshift circuitIBM·Filed 1992·Granted Dec 28, 1993·0 cites·5 claims
- 1828US5124591ALow power push pull driverIBM·Filed 1990·Granted Jun 23, 1992·2 cites·1 claims
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